نتایج جستجو برای: scattering ellipsometry
تعداد نتایج: 116656 فیلتر نتایج به سال:
We present here results which indicate that polymeric monolayers confined at the air–water interface may provide interesting model systems for the study of glass transition phenomenology in a strongly confined 2D geometry. We report on photoinduced relaxation of the pressure–area isotherms in Langmuir monolayers of a photosensitive polyacrylate, using null-ellipsometry to study the evolution of...
With spectroscopic ellipsometry one can measure the real and imaginary parts of the refractive index of a medium simultaneously. To determine this index in the infrared for a number of technical liquids, use was made of attenuated total internal reflection at the glass-liquid interface of a specially designed prism. This attenuated total reflection approach warrants minimal signal loss and is, ...
We have measured local electric field vectors of local polarizaton on the nanoscale using gold nanoparticle functionalized tips as local field scatterers. In our experiments, the local field induces a dipole-moment in the gold nanoparticle functionalized tip, which then radiates into the far-field, transferring the full information about the local electric field from the near into the far field...
Amorphous thin films from Ge-As-Te system were prepared by pulsed laser deposition to study their intrinsic photostability, morphology, chemical composition, structure and optical properties. Photostability of fabricated layers was studied by spectroscopic ellipsometry within as-deposited as well as relaxed (annealed) layers. For irradiation, laser sources operating at three wavelengths in band...
We report the experimental studies of the vibrational spectra of SrTiO3 films with the thickness of 1 μm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm and electric field-induced Raman scattering techniques have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of ...
Despite high internal quantum efficiencies, planar organic light-emitting diodes (OLEDs) typically suffer from limited outcoupling efficiencies. To improve this outcoupling efficiency, we have developed a new thin (∼2 μm) light scattering layer that employs air voids (low-index scattering centers) embedded in a high-index polyimide matrix to effectively frustrate the substrate-trapped light, in...
It is offered to operate the transmittance of a diffraction mask by changing the interference properties of a thin optical layer. Based on the results of the offered approach the amplitude-phase diffraction grating with the period of 300 microns has been made from the 115 nm transparent indium tin oxide (ITO) film. Optical and dimensional parameters of the diffraction mask have been investigate...
This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
Abstract The temperature dependence of the optical constants materials (refractive index, absorption and extinction coefficients, dielectric function) can be determined with spectroscopic ellipsometry over a broad range temperatures photon energies or wavelengths. Such results have practical value, for example applications at cryogenic elevated temperatures. gaps their broadenings also provides...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید