In accelerated life testing, the products are tested at high stress conditions and the results are used to draw inferences about the product lifetime at the normal stress condition. The products can fail due to one of the several possible causes of failure which need not be independent. In this paper, we consider the accelerated life testing in the presence of dependent competing risks. We prop...

This article focuses on the understanding and discussion of accelerated life test (AL T) procedures applied to reciprocal compressors. AL T procedures were analyzed and classified according to time proportional and proportional hazard models. Many papers were published and extensive research has been done in the area of AL T procedures. However, the fast paced changing world demands for a new g...

The main objective of accelerated life tests in this setting is the recovery of the distribution of the random variable representing lifetime which is difficult to observe at a certain level of a given stress factor. A general model for accelerated life test is proposed that utilizes the inverse problem approach, that is, the variable is observe at different level/s and the transfer function is...

Reliability is one of the main salient assets of modern electronic systems and its improvement is of utmost importance in manufacturingof high-reliability electronic products. The only possible means of improving the operational characteristics of electronic systems and reducing their overall lifecycle costs is improving their reliability. This is possible through designing in reliability at th...