an accelerated shelf-life test using elevated temperatures 62, 72 and 82 ˚c was conducted to predict the oxidation progression of walnuts over a long-term storage. oxidation parameters including values of conjugated dienes (cd) and trienes (ct) values and thiobarbituric acid (tba) value were employed to evaluate the oxidation processes. changes followed an apparent first-order kinetic. walnuts ...

Ti interdiffusion from the Ti/Pt/Au gate into the AlGaAs Schottky barrier layer (SBL) of 0.25-lm GaAs Pseudomorphic High Electron Mobility Transistors (PHEMTs) has been studied using the accelerated life testing technique. Based on measurements and modeling, analytical expressions for quantitative correlation between the positive pinch-off voltage (VP) shift as well as the saturation drain curr...

Accelerated life testing is awidely used tool for assessing the reliability of product components and materials. This paper is ituated in the world of planning such experiments. More specifically, ane w method to plan type I singly censored reliability e xperiments with variable test times will be conside red. A case study is performed in order to illustrate th e method.

Within the DFR concept, the methodology of Design of Experiments (DOE) can be applied in the design and manufacturing stages to improve product reliability. It can be used to systematically investigate the variables (factors) that influence the life of the product, thereby providing the analyst with information that can be used to improve reliability. The analysis can also be used in the produc...

By running life tests at higher stress levels than normal operating conditions, accelerated life testing quickly yields information on the lifetime distribution of a test unit. The lifetime at the design stress is then estimated through extrapolation using a regression model. To conduct an accelerated life test efficiently with constrained resources in practice, several decision variables such ...

The paper provides to reliability practitioners with a method (1) to estimate the robust Weibull family when the Taguchi method (TM) is applied, (2) to estimate the normal operational Weibull family in an accelerated life testing (ALT) analysis to give confidence to the extrapolation and (3) to perform the ANOVA analysis to both the robust and the normal operational Weibull family. On the other...

The design and development of reliable electronic systems is a highly challenging task. In this paper we present the results of research carried out in order to improve the reliability of the printed circuit boards of a high reliability electronic consumer product manufactured locally by the application of accelerated life testing and interconnect stress testing. Reliability improvement is a ma...

INTERNATIONAL JOURNAL OF ENGINEERING SCIENCES & RESEARCH TECHNOLOGY Estimation of Weibull Parameters In Accelerated Life Testing Using Geometric Process With Type-Ii Censored Data Mustafa Kamal Department of Statistics & Operations Research, Aligarh Muslim University, Aligarh-202002, India [email protected] Abstract In Accelerated life testing (ALT), generally, the log linear function bet...