The objective of this research is to develop built-in testing (BIT) techniques for the functional verification of analog and RF circuits and systems. The aim is to avoid the use of external analog instrumentation so that the cost of testing is reduced. The major challenges addressed by this work are: (1) To develop techniques for the on-chip test of integrated RF and analog circuits through a f...

This article reviews the assessment of polygraphic lie detection produced by the Office of Technology Assessment (OTA) in November 1983. The review argues that use of the lambda statistic to summarize polygraph accuracy in the OTA report was inappropriate because the studies examined differ widely in base rates of guilt and innocence. Using Lykken's (1981) average accuracy statistic and avoidin...

The conventional approach, widely practiced in the industry today, for testing analog circuits is by ensuring the circuit conforms to data-sheet limits on all its specifications. However, such a specification based test methodology suffers from high levels of test cost stemming from long test-times on expensive test equipment. In recent years the situation has only worsened with the advent of m...

This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasi...

This article aims to describe the fundamentals of analog and digital testing methods to analyze the difficulties of analog testing and to develop an approach to test the analog components in a mixed signal circuit environment. Oscillation based, built-in self-test methodology for testing analog components in mixed-signal circuits, in particular, is discussed. A major advantage of the OBIST meth...

Analog correlation is an important analog signal processing function. A new analog correlator circuit for implementing Spread Spectrum Time Domain Reflectometry (SSTDR) technique is proposed. SSTDR technique, makes locating intermittent faults possible, by continuously testing live wiring networks. The proposed correlator circuit is more linear by almost an order of magnitude and consumes half ...

KEYWORDS analog circuit – fault diagnosis – test vector –tolerance –test node – multifrequency-modified nodal analysis ABSTRACT A method to identify and select test points for analog circuit testing and to detect multiple soft faults in linear analog circuits using multiple frequency measurements is proposed in this paper. Modified nodal analysis (MNA) method is used to simulate the circuit und...