This paper presents a BIST architecture, based on a single micro-programmable BIST Processor and a set of memory Wrappers, designed to simplify the test of a system containing many distributed multi-port SRAMs of different sizes (number of bits, number of words), access protocol (asynchronous, synchronous), and timing.

Article history: Received 29 June 2010 Received in revised form 18 October 2012 Accepted 18 October 2012 Available online 20 November 2012 0045-7906/$ see front matter 2012 Elsevier Ltd http://dx.doi.org/10.1016/j.compeleceng.2012.10.00 q Reviews processed and approved for publication ⇑ Corresponding author. Tel.: +3

A bomb calorimeter is an apparatus used for measuring the performance of coal in term of heat of combustion. Recent awareness has been created regarding uncertainty of measurement, due to mainly two reasons. Laboratory accreditation, which has steadily been on the rise, which requires a estimation of uncertainty of measurement particularly in the field of calibration. Second, increased maturity...

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then detecting if the logic behaved as intended. The main advantage of LBIST is that it provides test capability without an external tester. In particular, safety-critical designs need to be tested and r...

A major reason why many developing nations have not made significant advancement in sustainable development (SD) agenda is the neglect of existing building stock which forms the bulk of built assets. Although sustainable development is a universal challenge, it cannot be approached in the same way for all nations, but rather practical response can be defined nationally or locally. This paper re...

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have left no choice but to accept new responsibilities that had been performed by group of technicians in the previous years. Design engineers who do not design systems with full testability had increased the possibility of product failures and missed market opportunities. BIST is...

This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K to 800K gates, pose significant challenges to logic BIST methodology, flow, and tools. The paper presents the process of generating a BIST-compliant core along with the logic BIST controller for at-speed testing. Compar...