نتایج جستجو برای: electron diffraction
تعداد نتایج: 350333 فیلتر نتایج به سال:
Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (≈2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter (≈1...
Single-shot ultrafast electron diffraction (UED) was introduced as a viable way to measure ultrafast processes, such as structural transitions in materials. For UED, the dynamics in a sample are induced by a femtosecond laser pulse and ultrashort electron bunches are used to probe the ultrafast processes in the sample. The ultracold charged particle cloud (UCPC) source researched in this work i...
The photocathode radio-frequency (RF) gun is a powerful electron source to generate a high-brightness femtosecond electron beam with energies of 1~3 MeV. The RF gun based relativistic ultrafast electron diffraction (UED) is a promising new technique that has the potential to probe directly structural changes at the atomic scale with sub-100 fs temporal resolution. In this paper, we analyze the ...
synthesis, identification and thermal behavior studies of nanoparticles cobalt (ii) bromide has been studied in this research. cobalt (ii) bromide was synthesized by planetary high-energy ball mill. the general formula of this compound is cobr2.6h2o. the synthesized nanoparticles were characterized by fourier transform infrared spectroscopy and also size and structure of synthesized nanoparticl...
In this paper, an insect classification method using scanning electron microphotographs is presented. Images taken by a scanning electron microscope (SEM) have a unique problem for classification in that visual features differ from each other by magnifications. Therefore, direct use of conventional methods results in inaccurate classification results. In order to successfully classify these ima...
X-ray, neutron and electron diffraction methods are widely used for the investigation of crystals. Each of these techniques has their own advantages in terms of element sensitivity, sample size requirements etc. and are chosen accordingly for structure determinations. A less obvious difference lies in the spatial resolution of these diffraction techniques. Here, we show that electron diffractio...
A novel diffraction effect in high-energy electron backscattering is demonstrated: the formation of element-specific diffraction patterns via nuclear recoil. For sapphire (Al(2)O(3)), the difference in recoil energy allows us to determine if an electron scattered from aluminum or from oxygen. The angular electron distribution obtained in such measurements is a strong function of the recoiling l...
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