Effects of a uniform magnetic field, the plasma inhomogeneity, and dust charge fluctuations on low-frequency dust-lower-hybrid drift waves have been investigated. Charging currents of electrons and ions to a spherical dust grain in a nonuniform magnetized dusty plasma have been calculated to study the charge fluctuation induced damping or growth of low-frequency drift waves. It is found that fo...

A novel effect of fast heating and charging a finite-radius plasma is discovered in the context of plasma wakefield acceleration. As the plasma wave breaks, most of its energy is transferred to plasma electrons. The electrons gain substantial transverse momentum and escape the plasma radially, which gives rise to a strong charge-separation electric field and azimuthal magnetic field around the ...

We present a comprehensive investigation of nonequilibrium effects and self heating in single electron transfer devices based primarily on the Coulomb blockade effect. During an electron trapping process, a hot electron may be deposited in a quantum dot or metal island, with an extra energy usually on the order of the Coulomb charging energy, which is much higher than the temperature in typical...

In trolley dilemmas a train is about to kill several victims who could be saved if instead a different victim is harmed. A number of theories have been proposed which assume that permissibility judgments in these harm-based moral dilemmas are mediated by an analysis of the underlying causal structure. For example, it has been postulated that it is permissible to harm people as a side effect but...

Plug-in hybrid electric vehicles (PHEVs) have been touted as a transportation technology with lower fuel costs and emissions impacts than other vehicle types. Most analyses of PHEVs assume that the power system operator can either directly or indirectly control PHEV charging to coordinate it with power system operations. This paper examines the incentives of individual drivers making charging d...

Hot-carrier reliability is studied in core logic PMOSFETs with a thin gate-oxide (Tox 1⁄4 2 nm) and in Input/Output PMOSFETs with a thick gate-oxide (6.5 nm) used for systems on chip applications. Hot-hole (HH) injections are found to play a more important role in the injection mechanisms and in the degradation efficiency. This depends on the technology node for stressing voltage conditions cor...