نتایج جستجو برای: micro spherical focused resistivity log msfl

تعداد نتایج: 433261  

Water saturation determination is one of the most important tasks in reservoir studies to predict oil and gas in place needed to be calculated with more accuracy. The estimation of this important reservoir parameter is commonly determined by various well logs data and by applying some correlations that may not be so accurate in some real practical cases, especially for carbonate reservoirs. Sin...

Journal: :CoRR 2015
Alexandre de Brébisson Pascal Vincent

In a multi-class classification problem, it is standard to model the output of a neural network as a categorical distribution conditioned on the inputs. The output must therefore be positive and sum to one, which is traditionally enforced by a softmax. This probabilistic mapping allows to use the maximum likelihood principle, which leads to the well-known log-softmax loss. However the choice of...

2010
Pascal Rozot

Currently, posterior chamber intraocular lenses (IOLs) correct totally or partially spherical aberrations. In this article we present the visual results of a prospective multicentre study evaluating the Micro AY IOL correcting 0.11μm of spherical aberration, which is a good compromise between optimal vision and a consistent depth of focus. We evaluated 124 eyes that were operated on using bi-ma...

Journal: :Optics express 2008
J Goldwin E A Hinds

We derive a formula for the light field of a monochromatic plane wave that is truncated and reflected by a spherical mirror. Within the scalar field approximation, our formula is valid even for deep mirrors, where the aperture radius approaches the radius of curvature. We apply this result to micro-fabricated mirrors whose size scales are in the range of tens to hundreds of wavelengths, and sho...

2014
Ji Young Kim Min-Wook Oh Seunghun Lee Yong Chan Cho Jang-Hee Yoon Geun Woo Lee Chae-Ryong Cho Chul Hong Park Se-Young Jeong

Resistivity is an intrinsic feature that specifies the electrical properties of a material and depends on electron-phonon scattering near room temperature. Reducing the resistivity of a metal to its potentially lowest value requires eliminating grain boundaries and impurities, but to date few studies have focused on reducing the intrinsic resistivity of a pure metal itself. We could reduce the ...

Journal: :Frontiers in Earth Science 2023

The unknown nature and complexity of non-uniform formations cause new difficulties challenges to the accurate detection electrical instruments in shallow formations. micro-cylindrically focused logging tool (MCFL) can provide three original measurement curves, RB 0, 1, 2, with different depths, which reflect flushing zone resistivity, mudcake thickness. In this study, finite element method was ...

Journal: :Physical chemistry chemical physics : PCCP 2014
Junbao Wang Wenbo Mi Laisen Wang Qinfu Zhang Dongliang Peng

An enhanced anomalous Hall effect is observed in heterogeneous uniform Fe cluster assembled films with different film thicknesses (ta = 160-1200 nm) fabricated by a plasma-gas-condensation method. The anomalous Hall coefficient (Rs) at ta = 1200 nm reaches its maximum of 2.4 × 10(-8) Ω cm G(-1) at 300 K, which is almost four orders of magnitude larger than bulk Fe. The saturated Hall resistivit...

Journal: :Microelectronics Reliability 2007
Zhanwei Liu Huimin Xie Daining Fang Changzhi Gu Yonggang Meng Weining Wang Yan Fang Jianmin Miao

The mechanical behaviors of microstructures and micro-devices have drawn the attention from researchers on materials and mechanics in recent years. To understand the rule of these behaviors, the deformation measurement techniques with micro/nanometer sensitivity and spatial resolution are required. In this paper, a micro-marker identification method is developed to measure microstructure deform...

2010
Y. S. Ow S. Azimi M. B. H. Breese E. J. Teo

The authors compare the effects of focused and broad MeV ion beam irradiation on the surface roughness of silicon wafers after subsequent electrochemical anodization. With a focused beam, the roughness increases rapidly for low fluences and then slowly decreases for higher fluences, in contrast to broad beam irradiation where the roughness slowly increases with fluence. This effect is important...

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