The hydrothermal crystallizations of two zeolite topologies (FAU and LTA) have been studied by simultaneous UV-Raman spectroscopy and X-ray diffraction in a home built setup. A wide angle X-ray diffractometer has been redesigned and combined with Raman components. The results revealed, despite similar structures of the starting gels, different aluminosilicate species evolved in the two systems,...

Figure S1: X-ray powder diffraction pattern of the iron oxide nanospheres sample. X-ray Powder diffraction (XRPD) was measured on a conventional in-house powder diffractometer using Cu Kα radiation. Rietveld refinement yields cubic lattice parameters of 8.362(2) Å for the nanospheres and 8.348(1) Å for the nanocubes, which are both close to the cubic spinel lattice parameter of maghemite. The r...

ZnSe-based heterostructures grown on GaAs substrates have been investigated for use in pindiode LED applications. ZnSe has a large band gap, 2.76 eV, as well as a near lattice match to GaAs, 5.6688 Å vs. 5.6538 Å, respectively. In this study a metallorganic vapor phase epitaxy (MOVPE) deposition technique is used to produce doped and undoped thin films of ZnSe on (100) GaAs. Understanding the e...

nowadays various methods are presented for synthesis of barium strontium titanate (bst) nanopowders with different morphology and properties. each of these (bst)s has got individual characterization that makes it suitable for a special application. every method has a special quality, causes it to have preference over the other methods. low processing temperature is a desired point which most of...

One of the smallest molecular cocrystals consisting of acetylene and ammonia is grown in situ on the X-ray diffractometer. The resulting 1:1 molecular cocrystal is composed of antiparallel layers of zigzag chains. Subunits of the crystal structure are already stable as small molecular aggregates as shown by ab initio calculations. These aggregates may be considered as infant stages of cocrystal...

Semiconductor substrates made from single crystal materials need to be cut precisely along a fixed axis during the manufacturing process of the semiconductor components. Thus, measuring the crystal orientation is critical. For these measurements, Xray techniques demonstrate the highest precision. This report presents an outline of two popular X-ray diffraction techniques, the diffractometer and...

Modeling of the X-ray diffractometer instrumental function for a given optics configuration is important both for planning experiments and for the analysis of measured data. A fast and universal method for instrumental function simulation, suitable for fully automated computer realization and describing both coplanar and noncoplanar measurement geometries for any combination of X-ray optical el...