نتایج جستجو برای: scanning probe microscopy

تعداد نتایج: 372734  

Journal: :Nature nanotechnology 2011
M Gierling P Schneeweiss G Visanescu P Federsel M Häffner D P Kern T E Judd A Günther J Fortágh

Scanning probe microscopes are widely used to study surfaces with atomic resolution in many areas of nanoscience. Ultracold atomic gases trapped in electromagnetic potentials can be used to study electromagnetic interactions between the atoms and nearby surfaces in chip-based systems. Here we demonstrate a new type of scanning probe microscope that combines these two areas of research by using ...

Journal: :The Review of scientific instruments 2010
L Chassagne S Blaize P Ruaux S Topçu P Royer Y Alayli G Lérondel

Combining the nanoscopic and macroscopic worlds is a serious challenge common to numerous scientific fields, from physics to biology. In this paper, we demonstrate nanometric resolution over a millimeter range by means of atomic-force microscopy using metrological stage. Nanometric repeatability and millimeter range open up the possibility of probing components and materials combining multiscal...

Journal: :Applied Physics Letters 1996

Journal: :Nanoscale Research Letters 2012

Journal: :Journal of Physics: Conference Series 2007

Journal: :Journal of the Vacuum Society of Japan 2011

Journal: :International Journal of Nanomedicine 2007
Yuan Fan Qian Chen Virginia M Ayres Andrew D Baczewski Lalita Udpa Shiva Kumar

Scanning probe recognition microscopy is a new scanning probe microscopy technique which enables selective scanning along individual nanofibers within a tissue scaffold. Statistically significant data for multiple properties can be collected by repetitively fine-scanning an identical region of interest. The results of a scanning probe recognition microscopy investigation of the surface roughnes...

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