Since its invention in the early 1980, scanning tunneling microscopy1-4 (STM) and techniques such as atomic force microscopy5 (AFM) that have evolved from it have become tools of paramount importance in fundamental studies of surfaces. In addition, increasing effort has been directed towards the use of STM and related techniques to address problems of technological interest, particularly in the...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Systematic studies on scanning probe lithography (SPL) methodologies have been performed using self-assembled monolayers (SAMs) on Au as examples. The key to achieving high spatial precision is to keep the tip-surface interactions strong and local. Approaches include three atomic force microscopy (AFM) based methods, nanoshaving, nanografting, and nanopen reader and writer (NPRW), which rely on...