نتایج جستجو برای: scattering ellipsometry
تعداد نتایج: 116656 فیلتر نتایج به سال:
In this paper, we studied the optical behavior of SiO2 thin films prepared via sol-gel route using spin coating deposition from tetraethylorthosilicate (TEOS) as precursor. Thin films were annealed at different temperatures (400-600oC). Absorption edge and band gap of thin layers were measured using UV-Vis spectrophotometery. Optical refractive index and dielectric constant were measured by ell...
10 11 Both visible and infrared (IR) spectroscopic ellipsometry have been employed to study the 12 structure of thin layers of bovine submaxillary mucin (BSM) adsorbed on poly(acrylic acid13 block-methyl methacrylate) (PAA-b-PMMA) copolymer and poly(methyl methacrylate) 14 surfaces at three pH values (3, 7 and 10). The adsorbed mucin layer on the copolymer surface 15 had the greatest thickness ...
A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approxi...
This paper discusses the fundamentals, applications, potential, limitations, and future perspectives of polarized light reflection techniques for the characterization of materials and related systems and devices at the nanoscale. These techniques include spectroscopic ellipsometry, polarimetry, and reflectance anisotropy. We give an overview of the various ellipsometry strategies for the measur...
This paper reviews the progress in the study of the structure of the surface of pure liquids made in the last 10–20 years. This area of research has benefited enormously in recent years from developments in experimental techniques (especially x-ray scattering methods based on third-generation synchrotron sources, and advanced optical techniques) and theory (particularly computer simulation and ...
UV-irradiation induced modification of PDMS films investigated by XPS and spectroscopic ellipsometry
UV-irradiation (172 nm) induced changes of PDMS surfaces were investigated with X-ray photoelectron spectroscopy (XPS) and spectroscopic ellipsometry (SE). Both methods indicate the modification of the PDMS to a silicalike surface (SiO2). These conclusions could be drawn from the elemental composition determined by XPS and the binding energy shifts in the XPS spectra of the Si 2p and O 1s level...
Nano-structuring enables us to add additional degrees of freedom the design optical elements. Especially possibility controlling polarization is great interest in field nano-structured optics. For being able exploit whole range form-birefringent phase shifts, aspect ratios resulting element are typically much higher than conventional diffractive elements (DOEs), which does not only pose a chall...
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