Due to the continuous technology scaling, soft error becomes a major reliability issue at nanoscale technologies. Single or multiple event transients at low levels can result in multiple correlated bit flips at logic or higher abstraction levels. Addressing this correlation is essentialion levels. Addressing this correlation is essential for accurate low-level soft error rate estimation, and mo...

Accurate modeling of the electrical masking effect of soft errors for combinational logic circuits represents a significant challenge in soft error rate analysis. Previous proposed models for electrical masking effect can introduce large estimation error. In this work, we use table lookup MOSFET models to accurately capture the nonlinear properties of submicron MOS transistors. Based on these m...

In this study, we investigated the impact of pulse quenching effect on the soft error vulnerabilities in combinational circuits. Simulation results illustrate that soft error vulnerabilities could be reduced by 4–16% for the benchmark circuits when the pulse quenching effect is introduced. By adjusting the cell orientations of the quenching cells in the layout, the soft error vulnerabilities co...

In this paper, we address the issue of soft errors in random logic and develop solutions that provide fault tolerance capabilities without logic duplication. First, we present a circuit level soft error mitigation technique which allows systems to operate without the performance overhead of soft error detection and correction circuitry. This is achieved by sampling data using our Soft Error Mit...

Soft errors are radiation induced ionization events that upset the logic state of the circuit. The sources of these radiations are cosmic in origin; hence traditionally these upsets affected the space and aviation electronics. Due to technology scaling, these upsets are manifesting as errors in general off-the-shelf electronics circuits and hence a good simulation and error estimation tool is n...

Soft errors, due to cosmic radiations, are the major reliability barrier for VLSI designs. The vulnerability of such systems to soft errors grows exponentially with technology scaling. To meet reliability constraints in a cost-effective way, it is critical to assess soft error reliability parameters in early design stage to optimize reliability in the entire design cycle. Unlike soft error mode...

We find the critical charge for a topologically massive gauge theory for any gauge group, generalising our earlier result for SU(2). The relation between critical charges in TMGT, singular vectors in the WZNW model and logarithmic CFT is investigated.