نتایج جستجو برای: yield improvement

تعداد نتایج: 495759  

2006
Christoph Beckermann Xingyun Shen Jiangping Gu

The results of a computational study of feeding and the promotion of feeding by yield improvement techniques is presented. The computer simulations were performed using a commercial solidification software package examining the simple plate-like geometries addressed in the SFSA feeding rules. Solidification criteria from the computer model were used to develop simulation determined feeding dist...

2015
Edson Barcelos Sara de Almeida Rios Raimundo N. V. Cunha Ricardo Lopes Sérgio Y. Motoike Elena Babiychuk Aleksandra Skirycz Sergei Kushnir

African oil palm has the highest productivity amongst cultivated oleaginous crops. Species can constitute a single crop capable to fulfill the growing global demand for vegetable oils, which is estimated to reach 240 million tons by 2050. Two types of vegetable oil are extracted from the palm fruit on commercial scale. The crude palm oil and kernel palm oil have different fatty acid profiles, w...

2017
M. N. Jadhav K. H. Inamdar

Casting has many process variations depending upon the material, the type of pattern, mould and the pouring technique like sand casting, investment casting, die casting, squeeze casting and lost foam casting. Sand casting is the most widely used process which can be used to produce intricate parts in almost every metal that can be melted. Casting defects analysis is process of finding the root ...

2012
Santiago Comba Ana Arabolaza Hugo Gramajo

Metabolic Engineering has undertaken a rapid transformation in the last ten years making real progress towards the production of a wide range of molecules and fine chemicals using a designed cellular host. However, the maximization of product yields through pathway optimization is a constant and central challenge of this field. Traditional methods used to improve the production of target compou...

Journal: :IEEE Trans. Reliability 2003
Chih-Tsun Huang Chi-Feng Wu Jin-Fu Li Cheng-Wen Wu

With the advance of VLSI technology, the capacity and density of memories is rapidly growing. The yield improvement and testing issues have become the most critical challenges for memory manufacturing. Conventionally, redundancies are applied so that the faulty cells can be repairable. Redundancy analysis using external memory testers is becoming inefficient as the chip density continues to gro...

2009
NIKAIDO Masafumi

Advancements consequent on the increase in functions and the decrease in the size and weight of home electrical appliances and various related devices have been promoting improvements to the micro-fabrication technologies. This trend is tending to bring about increases in the scale of the LSIs that are used in them. In the case of the LSIs, it is extremely important to ramp up and maintain a hi...

Journal: :The European respiratory journal 2014
Rosa Sloot Maarten F Schim van der Loeff Peter M Kouw Martien W Borgdorff

We aimed to determine the coverage and yield of tuberculosis contact investigation, and compliance with guidelines, and to identify opportunities for improvement. Data were extracted from records on contacts of pulmonary tuberculosis patients at the Public Health Service (Amsterdam, the Netherlands) from 2008 to 2011. Additional data were obtained from the national tuberculosis register. Among ...

2012
Mottaqiallah Taouil Said Hamdioui

Recent enhancements in process development enable the fabrication of three dimensional stacked ICs (3D-SICs) such as memories based on Wafer-to-Wafer (W2W) stacking. One of the major challenges facing W2W stacking is the low compound yield. This paper investigates compound yield improvement for W2W stacked memories using layer redundancy and compares it to wafer matching. First, an analytical m...

2006
Vazgen Karapetyan

The ability to improve the yield of integrated circuits through layout modification has been recognized and several techniques for yield enhanced routing and compaction have been developed. The approach described in this paper is aimed to improve the random defect limited yield of the VLSI design. The goal is achieved by increasing the design tolerance to short (extra material) and open (missin...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید