Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Modular products and reconfigurable testing processes are crucial in modern manufacturing. This paper discusses the concept of product modularity, test modules of increased reusability and exchangeability, and some aspects of design for testability. A methodology for design of modular products for testability in the presence of testing modules is developed. An integrated approach to design of m...

Test generation for sequential circuits is complicated by the fact that the initial internal state of a circuit, after power up, cannot be predicted. This is commonly referred to as the initializability problem. In this paper, we present a new solution to the initializability problem-self initializing memory elements (SIMEs). SIMEs are designed to initialize, at power up, to a known state. The ...

This paper presents a design-for-testability technique, called partially parallel scan chain ( PPSC ), which aims at reduction of test length for sequential circuits. Since the partially parallel scan chain allows to control and observe subset of flip-flops (FFs) concurrently during scan shift operations, the number of scan shift clocks is reduced.

This paper develops a Physical Design for Test (PDFT) metric that is directly related to the expected quality level (QL) contribution of a cell to a circuit, and it details experimental results showing the usefulness of this metric in predicting the quality level contribution of a cell to circuits that have yet to be designed. The PDFT metric shows what QL increase can be expected for the circu...

As can be seen in Figure 6.1, there is a stage called test development where it basically consists of three activities; test generation, fault simulation and design for testability implementation. Test generation is a method of generating an input sequence that can distinguish between good chip and defective chip when the input sequence (test sequence) is applied to the chip using a tester. Fau...

In this paper, we consider four test sequencing problems that frequently arise in Test Planning and Design For Testability (DFT) process. Specifically, we consider the following problems: 1) How to determine a test sequence that does not depend on the failure probability distribution? 2) How to determine a test sequence that minimizes expected testing cost while not exceeding a given testing ti...

background: in algeria, the data on infertility and its various causes are rare. recently, the introduction of assisted reproduction has allowed expecting that 300000 couples, which represent 7% of couples of reproductive age, face difficulty conceiving a child. knowing that most idiopathic cases are likely to be due to chromosomal abnormalities, we aimed to investigate genetic defects by karyo...