The Atomic Force Microscope (AFM) is a very important instrument for use in nanotechnology and biology since it can be used to measure a wide variety of objects, such as nano-particles and cells, either in air or liquid. However, the images that are measured using AFM are distorted because of the influence of the tip geometry and the dynamic response of the instrument. This influence means that...

The dynamic wetting properties of atomic force microscopy (AFM) tips are of much concern in many AFM-related measurement, fabrication, and manipulation applications. In this study, the wetting properties of silicon and silicon nitride AFM tips are investigated through dynamic contact angle measurement using a nano-Wilhelmy balance based method. This is done by capillary force measurement during...

The invention of atomic force microscopy (AFM) is having a great impact on various areas, such as nano metrology, materials science, surface science and biology (Binnig et al., 1986). The lateral resolution of AFM is mainly determined by the probe’s shape and physical property, especially the geometry and dimension of the probe end. Conventional AFM probe is pyramidal shape by micro-fabrication...

We report on the collapsing and reswelling ability of grafted poly(methyl vinyl ether) chains of different molecular architectures. In order to study the influence of constraints and confinement of the chains, the polymer was grafted onto AFM tips, as a model of a curved nano-sized surface, and onto macroscopic silicon substrates for comparison purposes. AFM-based force spectroscopy experiments...

This review outlines an emerging nano-imaging method referred to as Atomic Force Microscopy Infrared Microscopy that enables IR imaging with lateral nanoscale resolution based on combining AFM and optical methodologies. Atomic Force Microscopy Infrared Microscopy enables imaging with nanoscale resolution and enables simultaneously AFM topography imaging. This review outlines the methodology and...

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microsc...

No part of this work may be reproduced by print, photocopy or any other means without the permission in writing from the publisher. Cover page illustration: Front side; Three-dimensional AFM images of LSMO nanowires of different dimensions on STO substrates. Top one is having width 422nm, height 26nm and periodicity 600nm, left one is having width 292nm height 25nm and periodicity 600nm, and ri...

Wet individual Single walled carbon nanotube was observed at an atomic level with high resolution. This observation was achieved in a liquid cell containing water using a modified non-contact mode atomic force microscopy (NC-AFM) which, we believed, becomes the powerful tool for imaging nano-material in atomic scale. Consequently, the topography image showed many hexagons network of carbon atom...

Atomic force microscopy (AFM) has emerged as the only technique capable of real-time imaging of the surface of a living cell at nano-resolution. Since AFM provides the advantage of directly observing living biological cells in their native environment, this technique has found many applications in pharmacology, biotechnology, microbiology, structural and molecular biology, genetics and other bi...