نتایج جستجو برای: atomic force microscope
تعداد نتایج: 298371 فیلتر نتایج به سال:
In this paper, the free vibration behaviors and flexural sensitivity of atomic force microscope cantilevers with small-scale effects are investigated. To study the small-scale effects on natural frequencies and flexural sensitivity, the consistent couple stress theory is applied. In this theory, the couple stress is assumed skew-symmetric. Unlike the classical beam theory, the new model contain...
V-shaped and triangular cantilevers are widely employed in atomic force microscope (AFM) imaging techniques due to their stability. For the design of vibration control systems of AFM cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. A general differential quadrature element method (...
The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...
Since its invention in 1986 by Binnig, Quate, and Gerber, the atomic force microscope (AFM) has proven to be an extremely useful tool for examining the interactions of proteins with surfaces. Fibrinogen in particular has been used as a model protein to demonstrate new methodologies for studying protein behavior with AFM due to its unique size, shape, and function. Indeed, fibrinogen's central r...
Images and force measurements taken by an atomic-force microscope ( AFM) depend greatly on the properties of the spring and tip used to probe the sample’s surface. In this article, we describe a simple, nondestructive procedure for measuring the force constant, resonant frequency, and quality factor of an AFM cantilever spring and the effective radius of curvature of an AFM tip. Our procedure u...
6 Local flow variation (LFV) method of nonlinear time series analysis is applied to 7 develop a chaotic motion based atomic force microscope (AFM). The method is 8 validated by analyzing time series from a simple numerical model of a tapping mode 9 AFM. For both calibration and measurement procedures the simulated motions of 10 the AFM are nominally chaotic. However, the distance between a tip ...
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید