Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in mi...

PACS. 82.20K-Potential energy surfaces for chemical reactions. PACS. 71.45N-Calculations of total electronic binding energy. PACS. 68.65-Layer structures, intercalation compolU1ds and superlattices: growth, structure and non-electronic properties. PACS. 61.16D-Electron microscopy determinations (inc. scanning tunnelling microscopy methods). Abstract.-We investigate the microscopic mechanism of ...

Since the invention of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1986, over 5,000 publications have cited the article “Atomic Force Microscope” by G. Binnig, C.F. Quate, and C. Gerber (published in Physical Review Letters, 1986). This article presents a short review on the operating principle and possible applications of AFM with special attention ...

Scanning rates of the atomic force microscope (AFM) could be significantly increased by integrating the force sensing probe with microelectromechanical systems (MEMS). We present a micromachining method for batch fabrication of in-plane AFM probes that consist of an ultra-sharp silicon nitride tip on a single crystal silicon cantilever. Our fabrication method is fully compatible with the silico...

We applied force spectroscopy based on atomic force microscope (AFM) to demonstrate the possibility of measuring the interaction force between single quantum-dots (QDs) and living cells at single particle level under native conditions. In the force-distance cycle, we recorded the events of cellular uptake of single QDs and single QD detachment from the cell.

The atomic force microscope (AFM) was used to directly image hippocampal neurons and glia. Using chemically fixed and living cells it was possible to reconstruct three-dimensional cell structure and detect sub-cellular features such as the nucleus, mitochondria and filaments. By repeatedly scanning a single living cell we observed the movement of filaments beneath the cell membrane. Furthermore...

Submicrometer IR surface imaging was performed with a resolution better than the diffraction limit. The apparatus was based on an IR optical parametric oscillator laser and a commercial atomic force microscope and used, as the detection mechanism, induced resonant oscillations in an atomic force microscopy (AFM) cantilever. For the first time to our knowledge this was achieved with top-down ill...

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles...

We have developed a dynamic force microscope DFM working in a novel operation mode which is referred to as phase modulation atomic force microscopy PM-AFM . PM-AFM utilizes a fixed-frequency excitation signal to drive a cantilever, which ensures stable imaging even with occasional tip crash and adhesion to the surface. The tip-sample interaction force is detected as a change of the phase differ...

In recent years the atomic force microscope (AFM) has evolved from a high resolution imaging tool to an enabling platform for physical studies at the nanoscale including quantitative mapping of mechanical characteristics of surfaces providing simultaneous topography and mechanical property maps across the length scales. In the work presented here peak force tapping AFM was utilized to elaborate...