This article considers different automatic control paradigms allowing for varying degrees of agent cooperation and autonomy. In order to support the automatic verification of safety-relevant software controllers, it proposes the use of a generic testing pattern which can be instantiated such as to allow to optimize automatic test data generation with respect to the specific targets of the appli...

We describe a progression fiom pilot studies to development and use of domain-spec fzc verification and validation (V& v ) automation. Our domain is the testing of an AIplanning system that forms a key component of an autonomous spacecraft. We used pilot studies to ascertain opportunities for, and suitability OJ; automating various analyses whose results would contribute to V& V in our domain. ...

Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automate certain testing tasks have been devised. Nevertheless, a great deal of testing is still carried out manually. This paper gives an overview of different testing scenarios and shows how database techniques (e.g., decl...

muchine, " a progrum f o r uutomuticully generating syntacticully correct progrums (test cusrs> f o r checking compiler front ends. The notion of " clynumic grammur " is introduced und is used in a syntax-defining notution thut procides f o r context-sensitiuity. Exurnples demonstrute use of the syntax machine. The " syntax machine " discussed here automatically generates random test cases for ...

The European Space Agency (ESA) uses an engine to perform tests in the Ground Segment infrastructure, specially the Operational Simulator. This engine uses many different tools to ensure the development of regression testing infrastructure and these tests perform black-box testing to the C++ simulator implementation. VST (VisionSpace Technologies) is one of the companies that provides these ser...

An automatic test pattern generation (ATPG) method is presented for a scan-based test architecture which minimizes ATE storage requirements and reduces the bandwidth between the automatic test equipment (ATE) and the chip under test. To generate tailored deterministic test patterns, a standard ATPG tool performing dynamic compaction and allowing constraints on circuit inputs is used. The combin...

The paper presents implementation of a test pattern generation technique that uses cellular automaton construction based on the analysis of a pre-computed test set. The algorithm is included into the Java applet for automatic synthesis of the built-in self-test structure into a digital circuit modeled in VHDL.