نتایج جستجو برای: compression test

تعداد نتایج: 895459  

2013
B.Sakthi Bharathi

Test data compression is one of the main objectives to make reliable in testing System on chip design. The data compression mainly relies in the areas of hardware, time and power consumed. This paper presents an efficient test data compression method to achieve high compression ratio. The test patterns have 1, 0 and undefined (x) data. The test patterns are grouped such that to improve compress...

M Abu-Ayyad M.F Alzoubi, S Al-Hallaj

Flexible Polyurethane (PU) foam samples with different densities and chemical formulations were tested in quasi-static stress-strain compression tests. The compression tests were performed using the Lloyd LR5K Plus instrument at fixed compression strain rate of 0.033 s-1 and samples were compressed up to 70% compression strains. All foam samples were tested in the foam rise direction and their ...

Journal: :IEICE Transactions 2005
Hideyuki Ichihara Michihiro Shintani Tomoo Inoue

Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed ...

Journal: :J. Electronic Testing 2004
Anshuman Chandra Krishnendu Chakrabarty

We present an analysis of test application time for test data compression techniques that are used for reducing test data volume and testing time in system-on-a-chip (SOC) designs. These techniques are based on data compression codes and on-chip decompression. The compression/decompression scheme decreases test data volume and the amount of data that has to be transported from the tester to the...

Journal: :Integration 2014
S. Sivanantham M. Padmavathy Ganga Gopakumar P. S. Mallick J. Raja Paul Perinbam

In this paper, we present two multistage compression techniques to reduce the test data volume in scan test applications. We have proposed two encoding schemes namely alternating frequency-directed equal-run-length (AFDER) coding and run-length based Huffman coding (RLHC). These encoding schemes together with the nine-coded compression technique enhance the test data compression ratio. In the f...

Journal: :Menara 2023

Based on its quality, paving blocks are used in the construction sector and an alternative choice for surface pavement layers. Several other advantages concrete bricks (paving blocks) better than pavements economical maintenance, artistic terms of exterior a building, do not require heavy equipment to work/install, can be mass-produced. This study aims compare compressive strength using compres...

2012
S. SARAVANAN A. BALASUBRAMANIYAN

In all System-on-a-Chip (SoC) designs, there is a necessity to reduce the large test data volume and this is achieved by test data compression. One of the methods is the variable-to-variable length compression method. A selective run-length based compression which comes under variable-to-variable method is presented in this paper. The proposed work is based on threshold calculation on don’t car...

2016
K. R. Krishnapriya M. A. Muthiah

The continuous increase in complexity of system on chip (SOC) design has resulted in higher test data volume. In this paper, we have proposed a new test data compression technique using an iterative XOR Matrix. This compression is a lossless compression technique that reduces the amount of test data and therefore reduction in test time. Experimental results on ISCAS 89 benchmark circuits are ob...

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