The ellipsometric film thickness measurement precision for equivalent oxide thickness as prescribed by the International Technology Roadmap for Semiconductors is quite high. Although short-term precision on a single ellipsometric instrument can be quite high, deviations of measured film thickness from instrument-to-instrument and from lab-to-lab for short-term and long-term periods of time need...

The relaxation behaviors of thin polymer films show a strong dependence on temperature and film thickness. Direct quantitative detection of the relaxation behaviors of thin polymer films at nanometer scale by traditional instruments is however challenging. In this study, we employed atomic force microscopy (AFM)-based force-distance curve to study the relaxation dynamics and the film thickness ...

The film thickness of free-meniscus coating of a polymeric fiber with a non-wetting fluid was investigated. A polypropylene monofilament fiber was coated with various glycerol/water mixtures. With a small capillary number (Ca), a detectable liquid film did not form on the fiber due to the non-wettability of the fiber-liquid system. Above a certain threshold velocity, liquid was forced to wet th...

In this work, polyvinylchloride (PVC) membrane prepared via casting solution technique and phase inversion method. N, N dimethylacetamide (DMAC) was used as primary solvent and Tetrahydrofuran (THF) was used as a co-solvent. The effects of parameters such as membrane thickness, evaporation time of casting film before immersion precipitation and addition of polyethylenglchol (PEG) on PVC membran...

This paper investigates the difference between thickness of zinc-based alloys oxide films in dynamic condition using the oxide-metal-oxide (OMO) sandwich method and static condition by theoretical calculations. In dynamic condition, the thickness of the oxide film in the OMO sandwich sample was characterized by scanning electron microscopy (SEM). In the static condition, the thickness and type ...

GdBa2Cu3O7 - δ (GdBCO) films with different thicknesses from 200 to 2,100 nm are deposited on CeO2/yttria-stabilized zirconia (YSZ)/CeO2-buffered Ni-W substrates by radio-frequency magnetron sputtering. Both the X-ray diffraction and scanning electron microscopy analyses reveal that the a-axis grains appear at the upper layers of the films when the thickness reaches to 1,030 nm. The X-ray photo...

Many applications in a diverse demographic of engineering fields require knowledge of the thickness of thin films and coatings. An example of some applications for which thin film thickness is critical are semiconductors, optics, and protective coatings. There are various methods for measuring thin film thickness, however, many of them are destructive, or are only capable of measuring thickness...

In this article, an experimental investigation has been conducted to characterize the instantaneous thickness of the surface water film driven by high-speed airflow pertinent to aerodynamic icing and anti-icing modeling. Non-intrusive results of the film flowing on a metal plate were obtained using the high-speed camera and confocal chromatic technique. The wind speed (Ua) ranges from 17.8 m/s ...

In order to more accurately calculate the film stiffness of angular contact ball bearing, it is necessary to establish the film stiffness calculation model that is consistent with reality. The frictional heat exists in high-speed ball bearings, and can impact on oil film thickness and stiffness. The calculation model of film stiffness of an angular contact ball bearing taking account of the eff...

The electron subband structure in a thin (100) silicon film is analyzed based on a two-band k·p theory. For unprimed subbands the dependence of the nonparabolicity parameter on film thickness is obtained. The two-band k·p theory gives a thickness dependence of the effective masses for primed subbands. Limitations of the model are discussed. The importance of the nonparabolicity parameter depend...