نتایج جستجو برای: kramers kronig relations

تعداد نتایج: 147086  

2008

Multiple-wave Diffraction Anomalous Fine Structure (MDAFS), a new method combining the X-ray multiple-wave diffraction with diffraction anomalous fine structure (DAFS) technique, provides the long-range order structure information by measuring the multiple-wave diffraction profiles in the vicinity of an absorption edge. The real part of dispersion correction and fine structure function can be o...

2004

This paper examines the highand low-frequency asymptotic consequences of the Kramers-Kronig relations which hold for the real and imaginary parts of the Fourier transform of the response of any linear causal system. By knowing or assuming the highor low-frequency expansion of one of these functions, the corresponding asymptotic expansion of the other is easily determined, and furthermore the co...

2014
Matthew M. Haney Hisashi Nakahara

We demonstrate the connection between theoretical expressions for the correlation of ambient noise Rayleigh and Love waves and the exact surface-wave Green’s tensors for a point force. The surface-wave Green’s tensors are well known in the far-field limit. On the other hand, the imaginary part of the exact Green’s tensors, including near-field effects, arises in correlation techniques such as t...

2000
Markus H. Thoma

The application of generalized Kramers-Kronig relations, the so-called Leontovich relations, to thermal field theory is discussed. Medium effects contained in the full, thermal propagators can easily be taken into account by this method. As examples the collisional energy loss of a charged particle in a relativistic plasma and the radiation of energetic photons from a quark-gluon plasma are con...

Journal: :Review of Scientific Instruments 2015

Silicon thin layers are deposited on glass substrates with the thickness of 103 nm, 147 nm and 197 nm. The layers are produced with electron gun evaporation method under ultra-high vacuum condition. The optical Reectance and the Transmittance of produced layers were measured by using spectrophotometer. The optical functions such as, real and imaginary part of refractive index, real and imaginar...

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