An integrated microscope that combines different optical techniques for simultaneous imaging is demonstrated. The microscope enables spectral-domain optical coherence microscopy based on optical backscatter, and multiphoton microscopy for the detection of two-photon fluorescence and second harmonic generation signals. The unique configuration of this integrated microscope allows for the simulta...

An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...

A large radius secondary ion mass spectrometer (SIMS) has been used for in situ stable isotope analyses of geological samples at the scale of 1–10 mm. However, the original reflected light microscope of the CAMECA IMS 1280 SIMS had an optical resolution of 3.5 mm, which made it difficult to accurately position the analytical beam on the sample at the mm scale. We modified the optical microscope...

During the past two decades, there have been tremendous developments in near-field imaging and local probing techniques. Examples are the Scanning Tunneling Microscope (STM), Atomic Force Microscope (AFM), Near-field Scanning Optical Microscope (NSOM), Photon Scanning Tunneling Microscope (PSTM), and Scanning Thermal Microscope (SThM).Results showed that the average reflectance for a dopant con...

Using a vibrating opaque metallic tip, which periodically and locally modif ies the electromagnetic f ield distribution of a diffraction spot focused onto a sample surface through a microscope objective lens, we have observed optical resolution better than the diffraction limit both with topographical features and with purely optical ones. This procedure simultaneously generates a ref lection-m...

The essential optical components include a 5 mW polarized laser (HeNe); single mode, polarization preserving optical fiber with couplers; Wollaston prism, birefringent plate; water immersion 20x microscope objective; electro-optic modulator, and polarization analyzer. The interferometric microscope needs to be compact and stiff, a combination that can be achieved with Microbench components (LIN...

An atomic force microscope (AFM) and spectrometer combined system for in-situ thickness measurement of nano-porous alumina (PA) films is introduced. The AFM is applied to obtain the porosity of PA film, and then we calculate the effective refractive index by Maxwell-Garnett effective dielectric constant theory. The optical thickness of PA film is determined by reflective interference spectromet...

The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and thos...