نتایج جستجو برای: scanning probe microscope

تعداد نتایج: 272834  

Journal: :Physical review letters 2002
F Chen U Mohideen G L Klimchitskaya V M Mostepanenko

The lateral Casimir force between a sinusoidally corrugated gold coated plate and large sphere was measured for surface separations between 0.2 to 0.3 microm using an atomic force microscope. The measured force shows the required periodicity corresponding to the corrugations. It also exhibits the necessary inverse fourth power distance dependence. The obtained results are shown to be in good ag...

Journal: :The Review of scientific instruments 2011
Chulsoo Kim Jongkyu Jung Woosub Youm Kyihwan Park

Vibration is a key factor to be considered when designing the mechanical components of a high precision and high speed atomic force microscope (AFM). It is required to design the mechanical components so that they have resonant frequencies higher than the external and internal vibration frequencies. In this work, the mechanical vibration in a conventional AFM system is analyzed by considering i...

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