Related work concerning the vision-based control of nonholonomic robots, control of robot formations and use of zoom for metrology and control in robotics has been analyzed. A summary concerning visual servoing of nonholonomic robots and control of zoom is given in document 1. Literature about the control of robot formations is surveyed from the robustness point of view in the Iros paper, with ...

Curve and surface fitting is a relevant subject in computer vision and coordinate metrology. In this paper, we present a new fitting algorithm for implicit surfaces and plane curves which minimizes the square sum of the orthogonal error distances between the model feature and the given data points. By the new algorithm, the model feature parameters are grouped and simultaneously estimated in te...

This chapter introduces some basic concepts and ideas of computer vision, such as imaging geometry of cameras, single view geometry, and two-view geometry. In particular, the chapter presents two practical examples. One is on single view metrology, calibration, and reconstruction; the other is a hybrid method for reconstruction of structured scenes from two uncalibrated images. Mathematics is t...

We show how a generalized quantum metrology protocol can be implemented in a twomode Bose-Einstein condensate of n atoms, achieving a sensitivity that scales better than 1/n and approaches 1 /n^'^ for appropriate design of the condensate.

Measurements play a fundamental role in nowadays forensic activities, especially in criminal justice. Guilt or innocence and the severity of a sentence do often depend upon the results of measurements. On the other hand, it is well-known that measurement results are always affected by uncertainty, so that any decision based on measurement results carries an implicit risk of being wrong: uncerta...

2D-3D pose estimation is an important task for computer vision, ranging from robot navigation to medical intervention. In such applications as robot guidance, the estimation procedure should be fast and automatic, but in industrial metrology applications, the precision is typically a more important factor. In this paper, a new 3D approach for infrared data visualization precisely with the help ...

Research in nanoelectronics poses new challenges for metrology, but advances in theory, simulation and computing and networking technology provide new opportunities to couple simulation and metrology. This paper begins with a brief overview of current work in computational nanoelectronics. Three examples of how computation can assist metrology will then be discussed. The paper concludes with a ...

Risk and cost must be balanced in the design of semiconductor processing metrology. More specifically, one needs to balance the cost of operating the metrology tool, and the loss in terms of processing cost and yield due to the limited sampling and the time lapse between the occurrence and the correction of a process fault. In virtual metrology (VM), the real-time data produced by the processin...