This article uses empirical likelihood with estimating equations to model and analyze heavy censored accelerated life testing data. This approach flexibly and rigorously incorporates distribution assumptions and regression structures into estimating equations in a nonparametric estimation framework. Real-life examples of using available data to explore the regression functional relationship and...

In This Paper, we focus on estimating the expected total cost and expected cost rate for age replacement under warranty policy. We describe how to use design of Accelerated life testing (ALT) plans by assuming constant stress and life times are independently distributed as Exponentiated Pareto Distribution (EP) for predicting the cost of age replacement under warranty policy. This problem is st...

Abstract. A simple step-stress accelerated life testing plan is considered when the failure times in each level of stress are geometrically distributed under Type-I censoring. The problem of choosing the optimal plan is investigated using the asymptotic variance-optimality as well as determinant-optimality and probability-optimality criteria. To illustrate the results of the paper, an example i...

Article history: Received: 14.01.2014. Received in revised form: 01.03.2014. Accepted: 12.03.2014. Optoelectronic coupler, characterized by long life and high reliability, is one typical kind of optoelectronic devices. Accelerated degradation testing is mostly utilized to assess optoelectronic coupler storage life. However, in engineering, integrated optoelectronic coupler may be nagged with th...

In many of the studies concerning Accelerated life testing (ALT), the log linear function between life and stress which is just a simple re-parameterization of the original parameter of the life distribution is used to obtain the estimates of original parameters but from the statistical point of view, it is preferable to work with the original parameters instead of developing inferences for the...