نتایج جستجو برای: atomic force microscope
تعداد نتایج: 298371 فیلتر نتایج به سال:
A method to determine the spring constant of a rectangular atomic force microscope cantilever is proposed that relies solely on the measurement of the resonant frequency and quality factor of the cantilever in fluid ~typically air!, and knowledge of its plan view dimensions. This method gives very good accuracy and improves upon the previous formulation by Sader et al. @Rev. Sci. Instrum. 66, 3...
Atomic force microscopy is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution [1]. The universal character of repulsive forces between the tip and the sample, which are employed for surface analysis in AFM, enables examination of even single polymer molecules without disturbance of their integrity [2]. Being initially d...
nanotechnology involves the ability to see and control individual atoms and molecules which are about 100 nanometer or smaller. one of the major tools used in this field is atomic force microscopy which uses a wealth of techniques to measure the topography and investigates the surface forces in nanoscale. friction force is the representation of the surface interaction between two surfaces an...
a simple method has been employed to synthesize copper and copper oxide nanoparticles from copper (ii) succinate precursor by thermal decomposition method using oleylamine as a capping agent. the particles synthesized with oleylamine and triphenylphosphine were well dispersed nanoparticles obtained from x-ray diffraction (xrd). the synthesized copper nanoparticles were characterized by uv-visib...
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