Recently, atomic force microscopy (AFM) has been shown to be a suitable tool for imaging biological structures and their modification, adding to accurate morphological and cytomechanical information. AFM is capable of simultaneous nanometer spatial resolution and piconewton force detection, allowing detailed study of a cell surface morphology and monitoring of cell-tip interactions. Modern AFM ...

Use of the atomic force microscope (AFM) in quantitative force measurements inherently requires a theoretical framework enabling conversion of the observed deflection properties of the cantilever to an interaction force. In this paper, the theoretical foundations of using frequency modulation atomic force microscopy (FM-AFM) in quantitative force measurements are examined and rigorously elucida...

This study evaluated stimulated emission depletion (STED) microscopy, atomic force microscopy (AFM), and cryogenic scanning electron (Cryo-SEM), for visualising the morphology obtaining pore size information of agarose hydrogels.

We have developed a tool for performing surgical operations on living cells at nanoscale resolution using atomic force microscopy (AFM) and a modified AFM tip. The AFM tips are sharpened to ultrathin needles of 200-300 nm in diameter using focused ion beam etching. Force-distance curves obtained by AFM using the needles indicated that the needles penetrated the cell membrane following indentati...

v-shaped and triangular cantilevers are widely employed in atomic force microscope (afm) imaging techniques due to their stability. for the design of vibration control systems of afm cantilevers which utilize patched piezo actuators, obtaining an accurate system model is indispensable prior to acquiring the information related to natural modes. a general differential quadrature element method (...

We describe a three-dimensional 3D finite element analysis model of the contact between an atomic force microscopy AFM tip and a substrate with finite size subsurface structures. The model can simulate the contact stiffness measured by a scanning AFM tip on the surface of a sample with buried nanoscale structures. In addition to the analytical verification and convergence analysis, we present t...

We use the optical pickup head of a commercial compact disk (CD)/digital versatile disk (DVD) read only memory (ROM) drive to detect the vertical displacement of micro fabricated cantilever in atomic force microscopy (AFM). Both the contact and AC modes of AFM are demonstrated. The single atomic steps of graphite can be resolved, indicating that atomic resolution in the vertical displacement de...

We have developed a dynamic force microscope DFM working in a novel operation mode which is referred to as phase modulation atomic force microscopy PM-AFM . PM-AFM utilizes a fixed-frequency excitation signal to drive a cantilever, which ensures stable imaging even with occasional tip crash and adhesion to the surface. The tip-sample interaction force is detected as a change of the phase differ...

BACKGROUND Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recen...

This study demonstrates the advantages of the combination between atomic force microscopy and scanning electrochemical microscopy. The combined technique can perform nano-electrochemical measurements onto agarose surface and nano-electrografting of non-conducting polymers onto conducting surfaces. This work was achieved by manufacturing an original Atomic Force Microscopy-Scanning ElectroChemic...