نتایج جستجو برای: cad vlsi

تعداد نتایج: 32335  

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 1992
Balkrishna Ramkumar Prithviraj Banerjee

Most parallel algorithms for VLSI CAD proposed to date have one important drawback: they work ee-ciently only on machines that they were designed for. As a result, algorithms designed to date are dependent on the architecture for which they are developed and do not port easily to other parallel architectures. This paper describes a Portable object-oriented parallel environment for CAD algorithm...

Journal: :IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences 2023

Binary Decision Diagrams (BDDs) are an important data structure for the design of digital circuits using VLSI CAD tools. The ordering variables affects total number nodes and path length in BDDs. Finding a good variable is optimization problem previously many approaches have been implemented BDDs research works. In this paper, approach based on Spider Monkey Optimization (SMO) algorithm propose...

Journal: :AI Magazine 1989
Marwan A. Jabri

Design Automation: Automated FullCustom VLSI Layout Using the Ulysses Design Environment (Academic Press, Boston, Massachusetts, 1988, 463 pages) by Michael L. Bushnell deals with an interesting and challenging idea in very large-scale integration (VLSI) computer-aided design (CAD): the implementation of a top-down design process based on a script. A system called Ulysses that implements such a...

2000
A. ZERROUKI J. DUNOYER F. WAJSBÜRT A. DERIEUX

University Pierre and Marie Curie in Paris, offers a one-year course on Advanced CAD and VLSI design for post graduate students (DEA ASIME, DESS CISAN). This course starts with a general introduction to circuit and system architecture and a presentation of ALLIANCE[1], the educational CAD system developed by the ASIM team of the university. This first part lasts 4 weeks and aims to settle the b...

1996
John A. Chandy Steven Parkes Prithviraj Banerjee

ProperCAD II is a C++ object oriented library supporting actor based parallel program design. The library easily allows the design of data structures with parallel semantics for use in irregular applications. Inheritance mechanisms allow creation of the distributed data structures from standard C++ objects. This paper discusses the use of such distributed data structures in the context of a par...

Journal: :Infokommunikacionnye i radioèlektronnye tehnologii 2022

The effect of various types radiation and heavy nuclear particles on VLSI fabricated using CMOS technologies for bulk silicon at a level 250–90 nm is analyzed. Developed certified test crystals (TC) are constructive-topological circuit solutions elements digital libraries, complex-functional RAM blocks peripheral mixed-signal designing radiation-hardened the “system-on-chip” (SoC) type category...

1985
Hamideh Afsarmanesh Dennis McLeod David Knapp Alice C. Parker

This paper describes an approach to the specification and modeling of information associated with the design and evolution of VLSI components. The approach is characterized by combined structural and behavioral descriptions of a component. Database modeling requirements specific to the VLSI design domain are considered and techniques t.o address them are described. An extensible object-oriented...

1994
Renate Beckmann Ulrich Bieker Ingolf Markhof

This paper describes the application of CLP (constraint logic programming) to several digital circuit design problems. It is shown that logic programming together with efficient constraint propagation techniques is an adequate programming environment for complex real world problems like high level synthesis, simulation, code generation, and memory synthesis. Different types of constraints Boole...

1993
Israel A. Wagner Israel Koren

The yield of a VLSZ chip depends, among other factors, on the sensitivity of the chip to defects occurring during the fabrication process. To predict this sensitivity, one usually needs to compute the so-called critical area (Ac) which re&& how many and how large the defects must be in order to result in a circuit failure. The main computational problem in yield estimation is to calculate A, ef...

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