نتایج جستجو برای: ebsd

تعداد نتایج: 1580  

Journal: :Scientific reports 2015
T Schmid N Schäfer S Levcenko T Rissom D Abou-Ras

Raman microspectroscopy provides the means to obtain local orientations on polycrystalline materials at the submicrometer level. The present work demonstrates how orientation-distribution maps composed of Raman intensity distributions can be acquired on large areas of several hundreds of square micrometers. A polycrystalline CuInSe2 thin film was used as a model system. The orientation distribu...

2003
Mohammed H. Alvi Sunwook Cheong Hasso Weiland Anthony D. Rollett

The evolution of texture as a function of recrystallization has been characterized for hot-rolled AA1050. Samples prepared from a hot rolled sheet were annealed isothermally for sufficient time to allow complete recrystallization. The spatial orientation variation within the deformed microstructure of nucleation, growth and orientations of recrystallized grains is examined. The microstructural ...

2016
M. Godec D. A. Skobir Balantič

High operating temperatures can have very deleterious effects on the long-term performance of high-Cr, creep-resistant steels used, for example, in the structural components of power plants. For the popular creep-resistant steel X20CrMoV12.1 we analysed the processes of carbide growth using a variety of analytical techniques: transmission electron microscopy (TEM) and diffraction (TED), scannin...

2017
Kejian Li Qiang Zheng Chunhong Li Bin Shao Donglin Guo Dengming Chen Jianchun Sun Jiling Dong Pengjun Cao Keesam Shin

Plastic deformations, such as those obtained by shot peening on specimen surface, are an efficient way to improve the mechanical behavior of metals. Generally, scanning electron microscopy (SEM) and electron backscattered diffraction (EBSD) are commonly used to observe the complex microstructural evolutions, such as grain refinement and phase transformation, induced by the surface treatment. In...

2016
Wolfgang Wisniewski Marek Patschger Steliana Murdzheva Christian Thieme Christian Rüssel

Two glasses of the compositions 2 BaO - TiO2 - 2.75 GeO2 and 2 BaO - TiO2 -3.67 GeO2 (also known as BTG55) are annealed at temperatures from 680 to 970 °C to induce surface crystallization. The resulting samples are analyzed by X-ray diffraction (XRD) and scanning electron microscopy (SEM) including electron backscatter diffraction (EBSD). Ge-Fresnoite (Ba2TiGe2O8, BTG) is observed at the immed...

Journal: :Faraday discussions 2002
Joachim W Schultze Milan Pilaski Manuel M Lohrengel Uwe König

Passivation on polycrystalline Zr (hcp) and Ta (bcc) depends on the crystallographic orientation of the individual grains, determined by electron back scattering diffraction (EBSD). Microelectrochemical experiments yield characteristic data, such as oxide formation potentials, formation factors, capacities, and thicknesses, of local oxide formation on single grains. Strong differences occur on ...

Journal: :Journal of microscopy 2005
S C Wang Z Zhu M J Starink

Al-Mg-Cu-Mn alloys have been developed for the packaging industry, in which large cold-working deformations are normally applied that can produce high dislocation densities. In this study, we present a simplified model for the yield strength contributions and apply that to obtain the dislocation densities by determining the orientation factors, which can be obtained via the crystal information ...

Journal: :Microscopy and Microanalysis 2011

2007

In this appendix we provide a brief overview of some quantitative aspects of recrystallization, including the experimental techniques used to measure recrystallization, the determination of some of the parameters associated with the annealing processes, and the quantification of some important features of the associated microstructures. We do not attempt to cover the subject matter in detail, b...

2017
Dominik Kriegner Petr Harcuba Jozef Veselý Andreas Lesnik Guenther Bauer Gunther Springholz Václav Holý

The twin distribution in topological insulators Bi2Te3 and Bi2Se3 was imaged by electron backscatter diffraction (EBSD) and scanning X-ray diffraction microscopy (SXRM). The crystal orientation at the surface, determined by EBSD, is correlated with the surface topography, which shows triangular pyramidal features with edges oriented in two different orientations rotated in the surface plane by ...

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