نتایج جستجو برای: integrated circuit modelling

تعداد نتایج: 518221  

Journal: :Microelectronics Journal 2004
Jean-Luc Levant Mohammed Ramdani Richard Perdriau

Better prediction of electromagnetic compatibility (EMC) for components is becoming a topical demand, due to technology improvements. It is requested by integrated circuit (IC) manufacturers as well as by equipment integrators. The French UTE standardisation group has proposed an EMC modelling methodology for ICs, called ICEM (Integrated Circuit Electromagnetic Model). This proposal improves an...

1990
Thomas Lengauer

combinatorial algorithms for integrated circuit layout. Book lovers, when you need a new book to read, find the book here. Never worry not to find what you need. Is the combinatorial algorithms for integrated circuit layout your needed book now? That's true; you are really a good reader. This is a perfect book that comes from great author to share with you. The book offers the best experience a...

Journal: :IEEE Transactions on Industry Applications 2010

1990

Technologies for designing and building microelectronics-based computational equipment have been steadily advancing ever since the first commercial discrete circuits (ICs) were introduced in the late 1950s (1) (monolithic integrated circuits were introduced in the 1960s). As predicted by Moore's law in the 1960s (2), integrated-circuit density has been doubling approximately every 18 months, an...

2007
Ndubuisi Ekekwe

Most modern entertainment gadgets, equipment and tools incorporate integrated circuits that perform some specific functions that make the entertainment experience fascinating for users. From the simple toys for toddlers to the complex game studios in casinos, hardware forms a major component of entertainment technology. With the advent of integrated circuits, and subsequent development of CMOS ...

2008
S. Mir A. Bounceur F. Cenni M. Dubois R. Khereddine L. Kupka L. Lizarraga I. Mansouri J. Muller N. Nguyen L. Rufer E. Simeu H. Stratigopoulos

A Computer-Aided-Test (CAT) platform has been integrated in the Cadence Design Framework Environment for the evaluation of analogue/mixed-signal/RF Built-In-Self-Test (BIST) techniques. It comprises tools for statistical modelling of circuit performances, fault simulation, test generation and test optimization. The fault modelling and fault injection tools are simulator-independent, thus they a...

Journal: :Journal of the Experimental Analysis of Behavior 1967

Journal: :Journal of the Japan Society for Precision Engineering 1987

Journal: :Microelectronics Reliability 1991

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