As is well documented, platinum nanoparticles, promising for catalysts for fuel cells, exhibit better catalytic activities, when alloyed with Zn. Pre-existing syntheses of Pt-Zn alloy catalysts are composed of a number of complex steps. In this study, we have demonstrated that nanoparticles of Pt-Zn alloys are simply generated by electron-beam irradiation in a transmission electron microscope o...

Holes with different sizes from microscale to nanoscale were directly fabricated by focused ion beam (FIB) milling in this paper. Maximum aspect ratio of the fabricated holes can be 5:1 for the hole with large size with pure FIB milling, 10:1 for gas assistant etching, and 1:1 for the hole with size below 100 nm. A phenomenon of volume swell at the boundary of the hole was observed. The reason ...

Tungsten and nickel bimetallic nanoparticle is synthesized by radio frequency thermal plasma process which belongs to the vapor phase condensation technology. The morphology and chemical composition of the synthesized particle were investigated using the conventional nanoparticle transmission electron microscopy (TEM) sample. A few part of them looked like core/shell structured particle, but am...

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Publisher's copyright statement: Copyright (2005) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in (Petit, D. and Faulkner, C. C. and Johnstone, S. and Wood, D. and Cowburn, R. P. (2005) Nanometer scale patterning using focused ion be...

Focused ion beam (FIB) instrumentation has proven to be extremely useful for preparing cross-sectional samples for transmission electron microscopy (TEM) investigations. The two most widely used methods involve milling a trench on either side of an electron-transparent window: the “H-bar” and the “lift-out” methods [1]. Although these two methods are very powerful in their versatility and abili...

The level set method was generalized for simulating the evolution of surface multilayer substrates under focused ion beam irradiation. For a correct description such process calculations took into account sputtering yield angular dependences, densities irradiated materials and it considered that sputtered atoms can escape from different layers substrate. Comparison calculation results with expe...