نتایج جستجو برای: ionized cluster beam deposition

تعداد نتایج: 409113  

Journal: :Journal of the American Society for Mass Spectrometry 2021

Electrospray ion beam deposition (ES-IBD) or soft landing has been demonstrated as a technique suitable for processing nonvolatile molecules in vacuum under perfectly controlled conditions, an approach also desirable the of nanoparticles. Here, we present results from several approaches to generate, characterize, and deposit nanoparticle beams deposition. We focus on cluster generated by ESI or...

2008
M Hoener

The ionization and charge separation processes of nanoplasmas created by resonant excitation of atomic clusters in intense soft x-ray pulses have been investigated. Through irradiation with femtosecond pulses from the FLASH free electron laser (FEL) at λ = 13.7 nm and power densities exceeding 1014 W cm−2 the clusters are highly ionized with transient atomic charge states up to 9+. Variation of...

2006
C. L. O’Connell C. D. Barnes F.-J. Decker M. J. Hogan R. Iverson P. Krejcik R. Siemann D. R. Walz C. E. Clayton C. Huang D. K. Johnson C. Joshi W. Lu K. A. Marsh W. Mori M. Zhou

Plasma production via field ionization occurs when an incoming particle beam is sufficiently dense that the electric field associated with the beam ionizes a neutral vapor or gas. Experiments conducted at the Stanford Linear Accelerator Center explore the threshold conditions necessary to induce field ionization by an electron beam in a neutral lithium vapor. By independently varying the transv...

2004
D. Donadio

We have computed the elastic constants of nanostructured carbon films as obtained from classical molecular dynamics simulations of a cluster beam deposition process. The calculations show that the elastic constants of the deposited films are related to the average size of the clusters by a power law. This allows us to extrapolate the present theoretical data to the scale of the experimental res...

2012
G. Pöplau U. van Rienen

Light sources of the next generation such as ERLs require minimal beam losses as well as a stable beam position and small emittance over time. Instabilities caused by ionized residual gas have to be avoided. In this paper we present simulations of the behavior of ionized residual gas in the field of clearing electrodes and investigate e. g. clearing times. For these simulations we apply MOEVE P...

Journal: :Journal of the Japan Society for Precision Engineering 1990

Journal: :Journal of the Japan Society for Precision Engineering 1987

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