نتایج جستجو برای: scanning probe microscope

تعداد نتایج: 272834  

پایان نامه :دانشگاه آزاد اسلامی - دانشگاه آزاد اسلامی واحد شاهرود - دانشکده مهندسی شیمی 1393

در این پژوهش نحوه ساخت نانوکامپوزییت eva/ag و اثر ضد میکروبی آن در درصدهای مختلف نانو ذره نقره مورد بررسی قرار گرفته است.نانوکامپوزیت حاصل از نطر شکل شناختی ، اندازه ذرات، ساختمان شیمیایی ، با استفاده از تستهای sem(scanning electrou microscopy)،tem (transmission electron microscope) ، xrd (x-ray fluorescence spectroscopy) ،ftir (fourier transform infrared spectroscopy) مورد ارزیابی قرار گرفت. د...

Journal: :Journal of the Japan Society for Precision Engineering 1995

Journal: :The Review of scientific instruments 2013
Julian Stirling Richard A J Woolley Philip Moriarty

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data ...

2014
Henrik M. Ronnow Julian O. Piatek Pau Jorba

In the first part of this thesis we describe the functioning principle of the scanning hall probe microscope (SHPM), and we present a summary of the theoretical and experimental knowledge on the dipolar-coupled Ising ferromagnet LiHoF4. In the second chapter we present the experimental setup that allows us to perform SHPM imaging at ultra low temperatures. The main components; microscope head, ...

Journal: :Ultramicroscopy 2007
Xiaoping Qian J S Villarrubia

The ability to image complex general three-dimensional (3D) structures, including reentrant surfaces and undercut features using scanning probe microscopy, is becoming increasing important in many small length-scale applications. This paper presents a dexel data representation and its algorithm implementation for scanning probe microscope (SPM) image simulation (morphological dilation) and surf...

2004
A. L. K. Tan Y. C. Liu S. K. Tung

Since its introduction in 1986 as a tool for imaging and creating three-dimensional micrographs with resolution down to the nanometer and angstrom scales, the scanning probe microscope (SPM) has increasingly been acclaimed as a quantitative probe of surface forces such as adhesion. The SPM is able to study these important parameters using a technique that measures forces on the probe as it appr...

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