نتایج جستجو برای: transmission scanning

تعداد نتایج: 387563  

2007
S. J. Pennycook A. R. Lupini M. Varela A. Y. Borisevich Y. Peng M. P. Oxley K. van Benthem M. F. Chisholm

2009
L J Allen A J D’Alfonso S D Findlay J M LeBeau N R Lugg S Stemmer

We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the t...

Journal: :Proceedings of the National Academy of Sciences of the United States of America 1974
J Wall J Langmore M Isaacson A V Crewe

We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...

Journal: :Applied optics 2003
Ting-Chung Poon Taegeun Kim Kyu Doh

We propose a method for secure wireless transmission of encrypted information. By use of an encryption key, an image or document is optically encrypted by optical heterodyne scanning and hence encryption is performed on the fly. We call this technique optical scanning cryptography. The output of the heterodyne encrypted signal is at radio frequency and can be directly sent through an antenna to...

Journal: :IBM Journal of Research and Development 2011
Ilona Müllerová Milos Hovorka Ivo Konvalina Marek Uncovsky Ludek Frank

We discuss an extension to the transmission mode of the cathode-lens-equipped scanning electron microscope, enabling operation down to the lowest energies of electrons. Penetration of electrons through free-standing ultrathin films is examined along the full energy scale, and the contribution of the secondary electrons (SEs), released near the bottom surface of the sample, is shown, enhancing t...

Journal: :Nano letters 2008
Yuan Wang Werayut Srituravanich Cheng Sun Xiang Zhang

Nearfield scanning optical microscopy (NSOM) offers a practical means of optical imaging, optical sensing, and nanolithography at a resolution below the diffraction limit of the light. However, its applications are limited due to the strong attenuation of the light transmitted through the subwavelength aperture. To solve this problem, we report the development of plasmonic nearfield scanning op...

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