Scaling the minimum feature size of VLSI circuits to sub-quarter micron and its clock frequency to 2GHz has caused crosstalk noise to become a serious problem, that degrades the performance and reliability of high speed integrated circuits. This paper presents an efficient method for computing the capacitive crosstalk in sub-quarter micron VLSI circuits. In particular, we provide closed-form ex...

Transient faults in VLSI circuits could lead to disastrous consequences. With technology scaling, circuits are becoming increasingly vulnerable to transient faults. This papers presents an accurate and efficient method to estimate fault-sensitivity of VLSI circuits. Using a binary counter and an RC5 encryption implementation as examples, this paper shows that by performing a limited amount of r...

For parallel simulation of VLSI circuits on transistor level a sophisticated partitioning of the circuits into subcircuits is crucial. Each net connecting the subcircuits causes additional communication and computation effort. As the slave processors simulating the subcircuits advance synchronously in time, the computation effort for each subcircuit should be approximately the same. In this pap...

VLSI circuits design allows today to consider new modes of implementation for electrical controls. However, design techniques require an adaptation effort that few designers, too accustomed to the software approach, provide. The authors of this article propose to develop a methodology to guide the electrical designers towards optimal performances of control algorithms implementation. Thus, they...

Partitioning is a critical area of VLSI CAD. In order to build complex digital logic circuits it is often essential to sub-divide a circuit into smaller parts.Circuit partitioning plays an important role in physical design automation of very large scale integration(VLSI)chips.In VLSI.In VLSI circuit partitioning the problem of obtaining minimum cut is of prime importance.To enhance other criter...

VLSI (Very Large Scale Integration) circuits are basic components of today’s complex digital systems. In order to realize dependable digital systems, VLSI circuits should be highly reliable. VLSI testing plays an important role in satisfying this requirement. VLSI testing is to check whether faults exist in a circuit, and it consists of two main phases: test generation and test application. In ...

In this paper, the impact of gate induced drain leakage (GIDL) on the overall leakage of submicrometer VLSI circuits is studied. GIDL constitutes a serious constraint, with regards to off-state current, in scaled down complimentary metal–oxide–semiconductor (CMOS) devices for DRAM and/or EEPROM applications. Our research shows that the GIDL current is also a serious problem in scaled CMOS digit...

In this paper, the impact of gate induced drain leakage (GIDL) on overall leakage of submicron VLSI circuits is studied. GIDL constitutes a serious constraint, with regards to off-state current, in scaled down CMOS devices for DRAM and/or EEPROM applications. Our research shows that the GIDL current is also a serious problem in scaled CMOS digital VLSI circuits. We present the experimental and ...