The analysis of Re compounds has revealed a time-dependent photoreduction during x-ray photoelectron spectroscopy (XPS) measurements. Whilst such reduction of metal ions during XPS analysis is not uncommon, this is the first time that cases specifically for rhenium have been identified in the open literature.

Marcasite surfaces were analyzed using X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES). XPS data of a pristine marcasite surface are used as a template to examine the characteristics of a marcasite surface after exposure to vigorous cleaning procedures and after reaction in oxygenated and mildly acidic (pH 3.0) solution. Minor changes are observed to the Fe(2p3/2) s...

ozone modification method and air-oxidation were used for the surface treatment of polyacrylonitrile(pan)-based carbon fiber. the surface characteristics of carbon fibers were characterized by x-ray photoelectron spectroscopy (xps). the interfacial properties of carbon fiber reinforced polyamide 6 (cf/pa6) composites were investigated by means of the single fiber pull-out tests. as a result, it...

La1-xSrxAlO3 (x=0 to 0.4) perovskite materials were synthesized by the reverse strike co-precipitation method and their soot oxidation activity was evaluated. All the catalysts synthesized were characterized using XRD, BET specific surface area, FESEM and XPS techniques. As analyzed by XRD, La1-xSrxAlO3 <...

Peak fitting of x-ray photoelectron spectroscopy (XPS) data is the primary method for identifying and quantifying chemical states atoms near surface a sample. typically based on minimization figure-of-merit, such as residual standard deviation (RSD). Here, we show that optimal XPS peak obtained when shape (the synthetic mathematical function represents material) best matches physics chemistry u...

A noncontact chemical and electrical measurement X-ray photoelectron spectroscopy (XPS) technique is performed to investigate a CdS-based photoresistor during its operation. The main objective of the technique is to trace chemical- and location-specified surface potential variations as shifts of the XPS Cd 3d(5/2) peak position without and under photoillumination with four different lasers. The...

The reduction of surface “native” oxides from GaAs substrates following reactions with trimethylaluminum TMA precursor is studied using medium energy ion scattering spectroscopy MEIS and x-ray photoelectron spectroscopy XPS . MEIS measurements after one single TMA pulse show that 65% of the native oxide is reduced, confirmed by XPS measurement, and a 5 Å thick oxygen-rich aluminum oxide layer i...