The controlled introduction of dopant atoms to semiconducting host materials is the corner stone of electronic device fabrication. Dopant atoms provide a means to modulate the electronic, optical, and magnetic properties of semiconductors [1], and it is now possible to control dopant profiles with true atomic-scale precision in the laboratory [2]. Moreover, industrial fabrication methods are no...

Bimetallic metal-organic frameworks are rationally synthesized as templates and employed for porous carbons with retained morphology, high graphitization degree, hierarchical porosity, high surface area, CoNx moiety and uniform N/Co dopant by pyrolysis. The optimized carbon with additional phosphorus dopant exhibits excellent electrocatalytic performance for the oxygen reduction reaction, which...

To overcome the thermal instability of a p-doped organic hole transporting layer using the state-of-the-art p-type dopant, 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane, a potent electron accepter, 3,6-difluoro-2,5,7,7,8,8-hexacyanoquinodimethane, has been found to possess superior thermal stability and proved to be an excellent p-type dopant.

One of the ultimate goals in electron microscopy is 3-dimensional (3D) atomic scale information. The main challenge in obtaining 3D information in microscopy originates from the limited depth resolution. The depth resolution of scanning transmission electron microscopy (STEM) remains above ~10 nm, even with state-of the-art STEM with aberration correction [1]. Through-focal series and confocal ...

Local atomic structures of Zr and dopant cations in zirconia solid solutions with Fe,03, Ga203, Y203, and Gd203 .have been determined. The Zr ions in both partially stabilized tetragonal and fully stabilized cubic zirconia have their own characteristic structures which are dopant-independent. The dopant cations substitute for Zr ions despite severe local distortions necessitated by the large di...

During the past two decades, there have been tremendous developments in near-field imaging and local probing techniques. Examples are the Scanning Tunneling Microscope (STM), Atomic Force Microscope (AFM), Near-field Scanning Optical Microscope (NSOM), Photon Scanning Tunneling Microscope (PSTM), and Scanning Thermal Microscope (SThM).Results showed that the average reflectance for a dopant con...