Spot defects in memory devices are caused by imperfections in the fabrication process of these devices. In order to analyze the faulty effect of spot defects on the memory behavior, simulations have been performed on an electrical model of the memory in which the defects are injected, causing opens, shorts, or bridges. In this paper, simulation is used to analyze the faulty behavior of embedded...

As more engineering operations become automatic, the need for robustness towards faults increases. Hence, a fault tolerant control (FTC) scheme is a valuable asset. This paper presents a robust sensor fault FTC scheme implemented on a flexible arm manipulator, which has many applications in automation. Sensor faults affect the system's performance in the closed loop when the faulty sensor readi...

The main objective of this work is to provide a fault detection and isolation based on Markov parameters for residual generation and a neural network for fault classification. The diagnostic approach is accomplished in two steps: In step 1, the system is identified using a series of input / output variables through an identification algorithm. In step 2, the fault is diagnosed comparing the Mar...

A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by experiments on the Virtex-5 family of Xilinx FPGAs. High-level HDL code is developed to instantiate a Finite State Machine (FSM) which generates the test inputs for the Blocks Under Test (BUTs). The BUTs are divided int...

Consider a system consisting of a sender that wants to send a value to certain receivers. Byzantine agreement protocols [7, 6, 2] have been proposed to achieve this in the presence of arbitrary failures. The imposed requirement typically is that the fault-free receivers must all agree on the same value [7, 6]. (Dolev [2] analyzes a seemingly weaker form of agreement). It has been shown that suc...

Wireless Sensor Networks (WSNs) are arising from the proliferation of Micro-Electro-Mechanical Systems (MEMS) technology as an important new area in wireless technology. They are composed of tiny devices which monitor physical or environmental conditions such as temperature, pressure, motion or pollutants, etc. Moreover, the accuracy of individual sensor node readings is decisive in WSN applica...