نتایج جستجو برای: figure of merit
تعداد نتایج: 21167355 فیلتر نتایج به سال:
Rajeev Singh, Zhixi Bian, Ali Shakouri, Gehong Zeng, Je-Hyeong Bahk, John E. Bowers, Joshua M. O. Zide, and Arthur C. Gossard Baskin School of Engineering, University of California, Santa Cruz, California 95064, USA Department of Electrical and Computer Engineering, University of California, Santa Barbara, California 93106, USA Department Materials, University of Santa Barbara, California 93106...
Combining density functional theory and the nonequilibrium Green's function method, we investigate the thermoelectric properties of thin GaAs nanowires (NWs). After identifying the most stable structures for GaAs NWs, either in wurtzite (wz) or zinc blende (zb) stacking, we present a systematic analysis on the thermoelectric properties of these NWs and their dependence on stacking type (wz or z...
Thomas Lehmann,1,2 Dmitry A. Ryndyk,1,2,3 and Gianaurelio Cuniberti1,2,3 1Institute for Materials Science and Max Bergmann Center of Biomaterials, TU Dresden, 01062 Dresden, Germany 2Dresden Center for Computational Materials Science (DCMS), TU Dresden, 01062 Dresden, Germany 3Center for Advancing Electronics Dresden, TU Dresden, 01062 Dresden, Germany (Received 6 January 2015; revised manuscri...
Energy harvesting with triboelectric nanogenerators is a burgeoning field, with a growing portfolio of creative application schemes attracting much interest. Although power generation capabilities and its optimization are one of the most important subjects, a satisfactory elemental model that illustrates the basic principles and sets the optimization guideline remains elusive. We use a simple m...
Spotting tasks require detection of target patterns from a background of richly varied non-target inputs. The performance measure of interest for these tasks, called the figure of merit (FOM), is the detection rate for target patterns when the false alarm rate is in an acceptable range. A new approach to training spotters is presented which computes the FOM gradient for each input pattern and t...
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