نتایج جستجو برای: fuzzy control charts suggested by rose

تعداد نتایج: 7777449  

2017

The control chart (CC) is an important tool in Statistical Process Control (SPC) to improve the quality of products and processes. An unnatural variation in control maps assumes that an assignable cause affects the process is present, and some actions need to be applied to solve the problem. Thanks to their better recognition capability, NEURO-FUZZY is a powerful tool for process control and ra...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه علوم پایه دامغان 1389

in this thesis, ‎‎using‎‎ ‎concept‎s‎ ‎of‎ ‎wavelet‎s‎ ‎theory ‎‎‎som‎e‎ ‎methods‎‎ ‎of‎ ‎th‎e ‎solving‎‎ ‎optimal‎‎ ‎‎con‎tr‎ol‎ problems ‎(ocps)‎‎. ‎g‎overned by time-delay systems is investigated. ‎th‎is‎ thesis contains ‎tw‎o parts. ‎‎first, the method of obtaining ‎o‎f ‎the‎ ‎‎ocps‎ in time delay systems by linear legendre multiwavelets is ‎ ‎presented‎.‎‎‎‎ the main advantage of the meth...

2017

The control chart (CC) is an important tool in Statistical Process Control (SPC) to improve the quality of products and processes. An unnatural variation in control maps assumes that an assignable cause affects the process is present, and some actions need to be applied to solve the problem. Thanks to their better recognition capability, NEURO-FUZZY is a powerful tool for process control and ra...

Journal: :iranian journal of nursing and midwifery research 0
ali bikmoradi mehdi harorani ghodratollah roshanaei shirin moradkhani golam hossein falahinia

abstract background: pain is one of the common problems encountered by patients with burns, which increases after each dressing. this study aimed to investigate the effect of inhalation aromatherapy with damask rose essence on the pain of patients with burns that is caused after dressing. materials and methods: a randomized clinical trial was conducted on 50 patients with second‑ and third‑degr...

Journal: :Expert Syst. Appl. 2007
Kun-Lin Hsieh Lee-Ing Tong Min-Chia Wang

c-Chart was frequently used to monitor wafer defects during IC manufacturing. The clustering degree of defect on a wafer will increase along with the area of wafer gradually enlarging. The defect clustering causes the Poisson-based c-chart to exhibit many false alarms. Although several revised control charts have been developed to reduce the number of false alarms, those control charts still ha...

Journal: :International Journal of Computational Intelligence Systems 2011

Journal: :Zeszyty Naukowe Uniwersytetu Ekonomicznego w Krakowie 2015

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