It can be proved that 1/N ≤ DN ≤ 1 and 1/(2N) ≤ D∗ N ≤ DN ≤ 2D∗ N . The sequence X is uniformly distributed in [0, 1) if and only if limN→∞DN(X) = 0. We are interested in low-discrepancy sequences, that is, sequences X for which DN(X) is small for all N . The efficient construction of such X is essential in quasi-Monte Carlo algorithms used, for example, to approximate a multivariate integral o...

b. Nominative object: AGR P AGR ' s s 6 5 5 5 5 Spec AGR V NP PP s There 3PL are people at the door < LF movement c. Accusative object: AGR P AGR P AGR ' s o o 6 5 5 5 5 5 Spec Spec AGR V NP o John reads a book < LF movement In (1a), the "functional" head AGR enters into a double agreement relation s(ubject) with its specifier: the 0-features of the specifier are copied onto the head, and a Cas...

Sir, ‘References’ in an article includes the list of articles, books or the communications that have been referred to/consulted in presenting the document. They provide the source of the information being quoted in the article. The International Committee of Medical Journal Editors (ICMJE) has created the Uniform Requirements, primarily to help authors and editors in their mutual task of creati...

In order to study circuit complexity classes within NC in a uniform setting we need a uniformity condition which is more restrictive than those in common use Two such conditions stricter than NC uniformity Ru Co have appeared in recent research Immerman s families of circuits de ned by rst order formulas Im a Im b and a unifor mity corresponding to Buss deterministic log time reductions Bu We s...

A quantitative model capturing pattern density effects in Deep Reactive Ion Etch (DRIE), which are important in MEMS, is presented. Our previous work has explored the causes of wafer-level variation and demonstrated die-to-die interactions resulting from pattern density and reactant species consumption. Several reports have focused on experimental evidence and modeling of feature level (aspect ...

1 Abstract In order to study circuit complexity classes within NC 1 in a uniform setting, we need a uniformity condition which is more restrictive than those in common use. Two such conditions, stricter than NC 1 uniformity Ru81,Co85], have appeared in recent research: Immerman's families of circuits deened by rst-order formulas Im87a,Im87b] and a uniformity corresponding to Buss' deterministic...

We generalize various notions of generalized metrics even further to one general concept comprising them all. For convenience, we turn around the ordering in the target domain of the generalized metrics so that we speak of similarity instead of distance. Starting from an extremely general situation without axioms, we examine which axioms or additional properties are needed to obtain useful resu...

Here we present the principal ideas and results of [5] with some indications of proof. We introduce the notion of measure-theoretic uniformity, and we describe its use in recursion theory, hyperarithmetic analysis, and set theory. In recursion theory we show that the set of all sets T such that the ordinals recursive in T are the recursive ordinals has measure 1. In set theory we obtain all of ...

high efficiency and uniformity of water and fertilizer application are usually, considered as the ultimate goals of an appropriate design and management of irrigation and fertigation systems. the objective followed in this paper was to present a simulation-optimization model for alternate vs. conventional furrow fertigation. two simulation models (surface fertigation and swms-2d models) along w...

introduction: one of the major causes of image non-uniformity in mri is due to the existence of  non-homogeneity in rf receive and transmit. this can be the most effective source of error in  quantitative  studies  in  mri  imaging.  part  of  this  non-homogeneity  demonstrates  the  characteristics of rf coil and part of it is due to the interaction of rf field with the material being  imaged...