Low energy Ar ion sputtering, typically below 1,200 eV, of GaAs at normal beam incident angle is investigated. Surface morphology development with respect to varying energy is analyzed and discussed. Dot-like patterns in the nanometer scale are obtained above 600 eV. As the energy approaches upper eV range regular dots have evolved. The energy dependent dot evolution is evaluated based on solut...

Using a theoretical analysis of the ion beam sputtering dynamics, we demonstrate how ion bombardment on an initially sloped surface can create knife-edge-like ridges on the surface. These ridges arise as nonclassical shocklike solutions that are undercompressive on both sides and appear to control the dynamics over a large range of initial conditions. The slope of the ridges is selected uniquel...

Low-energy-ion bombardment of semiconductors can lead to the development of complex and diverse nanostructures. Of particular interest in these structured surfaces is the formation of highly ordered patterns whose optical, electronic, andmagnetic properties are different from those of bulk materials and might find technological uses. Compared to the low efficiency of lithographic methods for ma...

In the layered ferromagnetic/ferroelectric structures in form of cobalt, nickel or permendur layer on a ferroelectric substrate lead zirconate titanate obtained by ion-beam sputtering --- deposition, relative strains due to mismatch crystal lattices mating materials at metal/substrate in-terface make more noticeable contribution magnetoelectric response than those associated both with magnetost...

Reflective optics is one of the most useful techniques for focusing a neutron beam with a wide wavelength range since there is no chromatic aberration. Neutrons can be focused within a small area of less than 1 mm 2 by high-performance aspherical supermirrors with high figure accuracy and a low smooth substrate surface and a multilayer interface. Increasing the mirror size is essential for incr...

For more precise control of plasma etching processes, a better understanding of interaction of ions and radicals contained in plasmas with Si, SiO2 and SiN surfaces is desirable. In this study, mass-analyzed ion beam experiments were employed to clarify hydrogen effects during plasmas etching process containing hydrogen such as HBr and hydrofulorocarbon. It has been shown that H + ion injection...

The development of new fabrication techniques of plasmonic nanocomposites with specific properties is an ongoing issue in the plasmonic and nanophotonics community. In this paper we report detailed investigations on the modifications of the microstructural and plasmonic properties of metal-titania nanocomposite films induced by swift heavy ions. Au-TiO2 and Ag-TiO2 nanocomposite thin films with...

The focused ion beam (FIB)/scanning electron microscope (SEM) is a scanning microscope with an electron column and an ion column embedded in the same specimen chamber; both beams are aiming at the same point on the specimen surface. The FIB, generated by a Ga Liquid Metal Ion Source (LMIS), impacts the sample normal to the surface and can be focused to a spot as small as few nanometres. The FIB...