نتایج جستجو برای: low energy electron diffraction

تعداد نتایج: 2016027  

Journal: :Physical review letters 2001
D Naumović P Aebi L Schlapbach C Beeli K Kunze T A Lograsso D W Delaney

We report the in situ formation of an ordered equilibrium decagonal Al-Pd-Mn quasicrystal overlayer on the fivefold symmetric surface of an icosahedral Al-Pd-Mn monograin. The decagonal structure of the epilayer is evidenced by x-ray photoelectron diffraction, low-energy electron diffraction, and electron backscatter diffraction. This overlayer is also characterized by a reduced density of stat...

2016
Soichiro Tsujino Prat Das Kanungo Mahta Monshipouri Chiwon Lee R.J. Dwayne Miller

Achieving small transverse beam emittance is important for high brightness cathodes for free electron lasers and electron diffraction and imaging experiments. Double-gate field emitter arrays with on-chip focussing electrode, operating with electrical switching or near infrared laser excitation, have been studied as cathodes that are competitive with photocathodes excited by ultraviolet lasers,...

2012

The spatial resolution of electron diffraction within the scanning electron microscope (SEM) has progressed from channelling methods capable of measuring crystallographic characteristics from 10 μm regions to electron backscatter diffraction (EBSD) methods capable of measuring 120 nm particles. Here, we report a new form of low-energy transmission Kikuchi diffraction, performed in the SEM. Tran...

1999

This guide sheet outlines a method for the analysis of cubic crystal forms, this being useful to you for interpreting the transmission diffraction pattern produced by scattering electrons off a thin film target of polycrystalline aluminium. The apparatus also contains samples with hexagonal structures. These are pyrolytic graphite targets, and are available both as single crystals and in polycr...

1998
J. T. Jones E. T. Croke C. M. Garland O. J. Marsh T. C. McGill Thomas J. Watson

Using electron beam evaporation, a Si/CeO2/Si~111! structure has been grown in a molecular beam epitaxy machine. In situ low energy electron diffraction, cross sectional transmission electron microscopy, selected area diffraction, and atomic force microscopy have been used to structurally characterize the overlying silicon layer and show it to be single crystalline and epitaxially oriented. Rut...

پایان نامه :وزارت علوم، تحقیقات و فناوری - پژوهشگاه مواد و انرژی - پژوهشکده سرامیک 1392

thermal barrier coatings (tbcs) are used to provide thermal insulation to the hot section components of gas turbines in order to enhance the operating temperature and turbine efficiency. hot corrosion and thermal shocks are the main destructive factors in tbcs which comes as a result of oxygen and molten salt diffusion into the coating. in this thesis atmospheric plasma spraying was used to dep...

Journal: :Physical review letters 2008
T O Menteş A Locatelli L Aballe E Bauer

A stress-induced stripe phase of submonolayer Pd on W(110) is observed by low-energy electron microscopy. The temperature dependence of the pattern is explained by the change both in the boundary free energy and elastic relaxation energy due to the increasing boundary width. The stripes are shown to disorder when the correlation length of the condensed phase becomes comparable to its period, wh...

Journal: :Zeitschrift f�r Physik B Condensed Matter and Quanta 1977

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید