Thin films of LaS were prepared by using spray pyrolysis technique at 270 0 C and thickness were varied by changing the concentration of reactant solution. The films were optically characterized and their variations with film thickness were studies. It was found that thickness can be tuned by varying concentration of reactant solution. The band gap was found to vary between 2.35eV to 2.50eV. Th...

copper sulphide (cu 2 s) thin films at different thicknesses and annealing temperatures were deposited onto glass substrate by vacuum evaporation method. xrd study reveals the phase transformation of cu     2 s film at higher thickness. optical and resistivity study show the phase transformation of the film from cu     2 s to cus when they are annealed at higher temperature. sem st...

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surf...

We introduce and study a new 3d Topological Field Theory which can be associated to any compact real manifold X. This TFT is analogous to the 2d A-model and reduces to it upon compactification on an interval with suitable boundary conditions. It plays a role in 3d mirror symmetry as well as in the physical approach to the geometric Langlands duality. A similar TFT can be defined in four dimensi...

The paper describes new approach of potentiostat for very low sensor current measurements. Recent potentiostats were used as measurement devices which were standalone and sensors were connected by a screened wire. These concepts are inconvenient for the presented very low current measurements. The new approach is based on the potentiostat circuitry integrated on a chip that should be directly c...

Current methodologies used for the inference of thin film stress through curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis and co-workers [Huang, Y., Ngo, D., Rosakis, A.J., 2005. Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrat...