The aggressive technology scaling has significantly affected the circuit reliability. interaction of environmental radiation with devices in integrated circuits (ICs) may be dominant reliability aspect advanced ICs. Several techniques have been explored to mitigate effects and guarantee a satisfactory levels. In this context, estimating is crucial challenge that not yet overcome. For decades, s...

This paper illustrates how a combination of information retrieval, machine learning, and NLP corpus annotation techniques was applied to a problem of text content reliability estimation in Web documents. Our proposal for text content reliability estimation is based on a model in which reliability is a similarity measure between the content of the documents and a knowledge corpus. The proposal i...

Fast and accurate reliability estimation of integrated circuits is an open problem. Introducing the emerging nano devices such as FinFET and Stacked Silicon nanowires makes this problem even more challenging because of higher lithography fluctuation. We discuss several previous efforts for reliable circuit design and propose a methodology for accurate reliability estimation of novel transistors.