نتایج جستجو برای: scanning electron microscope

تعداد نتایج: 431395  

Journal: :Journal of Research of the National Institute of Standards and Technology 1994

Journal: :Okayama Igakkai Zasshi (Journal of Okayama Medical Association) 1979

Journal: :The Journal of Criminal Law, Criminology, and Police Science 1970

Journal: :Journal of clinical pathology 1971
S M Lewis G Lambertenghi S Ferrone G Sirchia

The morphology of red cells damaged by 2-aminoethylisothiouronium bromide (AET) has been compared to that of PNH cells by transmission and scanning electron microscopy. The main features of the effect of AET as demonstrated by the scanning electron microscope were spherical and deformed cells, with surface craters and relatively large pits. The transmission electron microscope revealed loss of ...

2007
Luděk Frank Filip Mika Miloš Hovorka Dimitrii Valdaitsev Gerd Schönhense Ilona Müllerová

Mechanisms responsible for the contrast between differently doped areas in semiconductors, which is observed in electron micrographs, is discussed as regards the key factors determining the sign and magnitude of the contrast. Experimental data obtained by means of the scanning electron microscope (SEM), scanning low energy electron microscope and photoelectron emission microscope are reviewed t...

پایان نامه :وزارت علوم، تحقیقات و فناوری - پژوهشگاه مواد و انرژی - پژوهشکده سرامیک 1386

چکیده ندارد.

2014
Luca Levrini Giulia Di Benedetto Mario Raspanti

Dental wear can be differentiated into different types on the basis of morphological and etiological factors. The present research was carried out on twelve extracted human teeth with dental wear (three teeth showing each type of wear: erosion, attrition, abrasion, and abfraction) studied by scanning electron microscopy (SEM). The study aimed, through analysis of the macro- and micromorphologic...

2013
A. Mohammadi-Gheidari C. W. Hagen P. Kruit

The authors present the first results obtained with their multibeam scanning electron microscope. For the first time, they were able to image 196 array of 14 14 focused beams of a multielectron beam source on a specimen using single beam scanning electron microscope SEM optics. The system consists of an FEI Novanano 200 SEM optics column equipped with a multielectron beam source module. The sou...

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