Extensive studies on polymer thin films to date have revealed their interesting but unusual properties such as film thickness dependence of glass transition temperature Tg and thermal expansivity. Recent studies have shown that the lower Tg is not always related to the higher mobility in polymer thin films, which contradicts our current understanding of the glass transition process. In this wor...

A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight depart...

Spectroscopic ellipsometry together with an effective medium model is used to determine simultaneously the effective refractive index, thickness, and metal volume fraction of thin nanocomposite films. The films are formed by Bi nanocrystals embedded in amorphous matrices, either semiconducting ~Ge! or dielectric (Al2O3). For the Bi:Ge films ~metal in an absorbing host!, the values obtained for ...

Abstract Nanopillars of ZnO were implanted with Au-400 keV ions at various ion fluences from 1 × 10 15 cm −2 to 16 and subsequently annealed 750 °C for min in order reduce the implantation damage support Au nanoparticle (NP) aggregation. It was found that implantation-induced effects thermal influence NP coalescence as well quality nanopillars. Rutherford Back-Scattering spectrometry (RBS) show...

The competitive adsorption of collagen and bovine serum albumin (BSA) on surfaces with varied wettability was investigated with imaging ellipsometry, and ellipsometry. Silane modified silicon surfaces were used as substrates. The results showed that surface wettability had an important effect on protein competitive adsorption. With the decrease of surface wettability, the adsorption of collagen...

Variable angle spectroscopic ellipsometry is a nondestructive technique for accurately determining the thicknesses and refractive indices of thin films. Experimentally, the ellipsometry parameters psi and Delta are measured, and the sample structure is then determined by one of a variety of approaches, depending on the number of unknown variables. The ellipsometry parameters have been inverted ...

Optical determination of shallow carrier profiles using Fourier transform infrared ellipsometry" (1998). Faculty Publications from the Department of Electrical and Computer Engineering. 23. Dopant profiles were determined by ex situ Fourier transform infrared variable-angle spectroscopic ellipsometry. The technique exploits carrier absorption in the mid-infrared spectral range and combines the ...

A new application of infrared ellipsometry is reported. Specifically, the interdiffusion between thin films of miscible polymers (poly(methyl methacrylate) and poly(vinylidene fluoride)) is detected in a non-invasive measurement. A novel technique of data analysis for interdiffusion was developed and is described. The validity of the approach is supported by simulations of diffusion in a bilaye...

17O(p,p)17O elastic scattering cross sections were measured for the first time, on INSP SAFIR platform in Paris, using thin silica films prepared by thermal oxidation of Si under 17O2. The 17O content film was determined a combination ellipsometry and IBA measurements. yield elastically scattered protons from corresponding peak Elastic Backscattering spectra, with underlying signal reduced chan...