نتایج جستجو برای: transmission electron microscopy
تعداد نتایج: 604183 فیلتر نتایج به سال:
Journal:
:Acta Crystallographica Section A Foundations of Crystallography
2009
Journal:
:Journal of Physics: Conference Series
2008
Journal:
:Microscopy Today
2023
Abstract Performance, usability, and even availability of 4D-scanning transmission electron microscopy (STEM) measurements have historically been compromised by the lack integration 4D-STEM components on (S)TEM columns that were not originally designed for this purpose. This article introduces TESCAN TENSOR, world’s first dedicated instrument multimodal characterization nanoscale morphological,...
Journal:
:Crystal Research and Technology
2000
Journal:
:Materials Today
2003
Journal:
:Microscopy and Microanalysis
2016
Journal:
:Le Journal de Physique Colloques
1982
Journal:
:Vacuum and Surface Science
2018
Journal:
:Procedia Engineering
2012
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