In this work, we use an experimentally calibrated 3D quantum mechanically corrected device simulation to study the random dopant fluctuation (RDF) on DC characteristics of 16-nm-gate trapezoidal bulk fin-type field effect transistor (FinFET) devices. The fixed top-fin width, which is consistent with the realistic process by lithography, of trapezoidal bulk FinFET devices is considered in this s...

This paper presents a numerical solution for vibration analysis of a cantilever trapezoidal thick plate. The material of the plate is considered to be graded through the thickness from a metal surface to a ceramic one according to a power law function. Kinetic and strain energies are derived based on the Reissner-Mindlin theory for thick plates and using Hamilton's principle, the governing equa...

We introduce a lateral atomic force microscopy (AFM) method to measure the hydrodynamic drag force acting on a microscopic emulsion droplet moving parallel to a flat surface. A tetradecane oil droplet formed in an aqueous solution of sodium dodecylsulfate was attached to a V-shaped atomic force microscopy cantilever, and lateral hydrodynamic interactions between the droplet and a flat glass sur...

Horizontally assembled trapezoidal piezoelectric cantilevers driven by magnetic coupling were fabricated for rotational energy harvester applications. A dodecagonal rigid frame with an attached array of six served as a stator electrical power generation. rotor disk permanent magnets (PMs) interacted magnetically the counterpart cantilever’s tip-mass PMs motion. Each cantilever beam was designed...

A method for the simultaneous calibration of the spring constants of all flexural modes of microcantilevers is presented. It is based on a flow of gas from a microchannel that interacts with the microcantilever. The gas flow causes a measurable shift in the resonance frequencies of thermal noise spectra of the flexural modes. From the magnitude of the frequency shifts of the individual modes th...

The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response...

Variations in the mechanical properties of nominally identical V-shaped atomic force microscope (AFM) cantilevers sourced from the same silicon nitride wafer have been quantified by measuring the spring constants, resonant frequencies and quality factors of 101 specimens as received from the manufacturer using the thermal spectrum method of Hutter and Bechhoefer. The addition of thin gold coati...